SEMICONDUCTOR DEVICE MANUFACTURING METHOD

PROBLEM TO BE SOLVED: To reduce loss of a resin material for forming an insulation film and form a pattern with high accuracy.SOLUTION: A semiconductor device manufacturing method including a formation process of an insulation film for a protection film, an encapsulation film and the like comprises...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MIYAMOTO TSUTOMU, SEKITA NOBUATSU, KANEKO NORIHIKO, KONO ICHIRO
Format: Patent
Sprache:eng ; jpn
Schlagworte:
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