X-RAY INSPECTION DEVICE
PROBLEM TO BE SOLVED: To provide an inspection device that can estimate whether the contents are caught in a seal portion of a packaging material without estimating the seal portion.SOLUTION: An X-ray inspection device estimates that a seal portion S1 is caught in the contents when a shortest distan...
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| creator | HARADA HIKARI SUGIMOTO KAZUYUKI |
| description | PROBLEM TO BE SOLVED: To provide an inspection device that can estimate whether the contents are caught in a seal portion of a packaging material without estimating the seal portion.SOLUTION: An X-ray inspection device estimates that a seal portion S1 is caught in the contents when a shortest distance D between the contents of adjacent individual packages is less than a threshold Tmin, because one or both of the contents are likely caught in the seal portion S1.
【課題】シール部を推定することなく、内容物が包材のシール部分に噛み込まれているか否かを推定することができる検査装置を提供する。【解決手段】Ｘ線検査装置では、隣接する個包装の内容物同士の最短距離Ｄが閾値Ｔｍｉｎよりも小さいときは、一方または双方がシール部分Ｓ１に噛み込んでいる可能性が高いので、シール部分Ｓ１に内容物が噛み込んでいると推定する。【選択図】図１１ |
| format | Patent |
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【課題】シール部を推定することなく、内容物が包材のシール部分に噛み込まれているか否かを推定することができる検査装置を提供する。【解決手段】Ｘ線検査装置では、隣接する個包装の内容物同士の最短距離Ｄが閾値Ｔｍｉｎよりも小さいときは、一方または双方がシール部分Ｓ１に噛み込んでいる可能性が高いので、シール部分Ｓ１に内容物が噛み込んでいると推定する。【選択図】図１１</description><language>eng ; jpn</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150507&DB=EPODOC&CC=JP&NR=2015087371A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150507&DB=EPODOC&CC=JP&NR=2015087371A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HARADA HIKARI</creatorcontrib><creatorcontrib>SUGIMOTO KAZUYUKI</creatorcontrib><title>X-RAY INSPECTION DEVICE</title><description>PROBLEM TO BE SOLVED: To provide an inspection device that can estimate whether the contents are caught in a seal portion of a packaging material without estimating the seal portion.SOLUTION: An X-ray inspection device estimates that a seal portion S1 is caught in the contents when a shortest distance D between the contents of adjacent individual packages is less than a threshold Tmin, because one or both of the contents are likely caught in the seal portion S1.
【課題】シール部を推定することなく、内容物が包材のシール部分に噛み込まれているか否かを推定することができる検査装置を提供する。【解決手段】Ｘ線検査装置では、隣接する個包装の内容物同士の最短距離Ｄが閾値Ｔｍｉｎよりも小さいときは、一方または双方がシール部分Ｓ１に噛み込んでいる可能性が高いので、シール部分Ｓ１に内容物が噛み込んでいると推定する。【選択図】図１１</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBCP0A1yjFTw9AsOcHUO8fT3U3BxDfN0duVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhqYGFubG5oaOxkQpAgAMpR_T</recordid><startdate>20150507</startdate><enddate>20150507</enddate><creator>HARADA HIKARI</creator><creator>SUGIMOTO KAZUYUKI</creator><scope>EVB</scope></search><sort><creationdate>20150507</creationdate><title>X-RAY INSPECTION DEVICE</title><author>HARADA HIKARI ; SUGIMOTO KAZUYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2015087371A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2015</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HARADA HIKARI</creatorcontrib><creatorcontrib>SUGIMOTO KAZUYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HARADA HIKARI</au><au>SUGIMOTO KAZUYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>X-RAY INSPECTION DEVICE</title><date>2015-05-07</date><risdate>2015</risdate><abstract>PROBLEM TO BE SOLVED: To provide an inspection device that can estimate whether the contents are caught in a seal portion of a packaging material without estimating the seal portion.SOLUTION: An X-ray inspection device estimates that a seal portion S1 is caught in the contents when a shortest distance D between the contents of adjacent individual packages is less than a threshold Tmin, because one or both of the contents are likely caught in the seal portion S1.
【課題】シール部を推定することなく、内容物が包材のシール部分に噛み込まれているか否かを推定することができる検査装置を提供する。【解決手段】Ｘ線検査装置では、隣接する個包装の内容物同士の最短距離Ｄが閾値Ｔｍｉｎよりも小さいときは、一方または双方がシール部分Ｓ１に噛み込んでいる可能性が高いので、シール部分Ｓ１に内容物が噛み込んでいると推定する。【選択図】図１１</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; jpn |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | X-RAY INSPECTION DEVICE |
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