TOOL FOR CORRECTION
PROBLEM TO BE SOLVED: To provide a tool for correction allowing an accurate correction value to be obtained when correction such as open correction and short correction is performed.SOLUTION: A tool 10 for correction is used in performing correction for reducing an error in impedance measurement of...
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| creator | YAMAKOSHI HIDETO |
| description | PROBLEM TO BE SOLVED: To provide a tool for correction allowing an accurate correction value to be obtained when correction such as open correction and short correction is performed.SOLUTION: A tool 10 for correction is used in performing correction for reducing an error in impedance measurement of measuring objects 50 via a probe 60 connected to an impedance measuring instrument. The tool 10 for correction includes a plurality of holding units 22 sandwiched between a pair of electrodes 61 included in the probe 60. The holding units 22 are made of resin as a material. The thickness of the plurality of holding units 22 is set at a dimension corresponding to the entire length of each of the measuring objects 50 having different sizes.
【課題】オープン補正およびショート補正のような補正を行う場合において、精度の高い補正値を得ることが可能な補正用治具を提供する。【解決手段】インピーダンス測定器に接続されるプローブ６０を介して、被測定物５０のインピーダンス測定における誤差を低減するための補正を行う際に用いられる補正用治具１０であり、プローブ６０が備える一対の電極６１によって挟み込まれる複数の挟持部２２を備え、この挟持部２２は、樹脂を材質として形成され、複数の挟持部２２の厚みは、サイズの異なる被測定物５０のそれぞれの全長に対応する寸法に設定されている。【選択図】図１ |
| format | Patent |
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【課題】オープン補正およびショート補正のような補正を行う場合において、精度の高い補正値を得ることが可能な補正用治具を提供する。【解決手段】インピーダンス測定器に接続されるプローブ６０を介して、被測定物５０のインピーダンス測定における誤差を低減するための補正を行う際に用いられる補正用治具１０であり、プローブ６０が備える一対の電極６１によって挟み込まれる複数の挟持部２２を備え、この挟持部２２は、樹脂を材質として形成され、複数の挟持部２２の厚みは、サイズの異なる被測定物５０のそれぞれの全長に対応する寸法に設定されている。【選択図】図１</description><language>eng ; jpn</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2015</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150202&DB=EPODOC&CC=JP&NR=2015021728A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150202&DB=EPODOC&CC=JP&NR=2015021728A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAMAKOSHI HIDETO</creatorcontrib><title>TOOL FOR CORRECTION</title><description>PROBLEM TO BE SOLVED: To provide a tool for correction allowing an accurate correction value to be obtained when correction such as open correction and short correction is performed.SOLUTION: A tool 10 for correction is used in performing correction for reducing an error in impedance measurement of measuring objects 50 via a probe 60 connected to an impedance measuring instrument. The tool 10 for correction includes a plurality of holding units 22 sandwiched between a pair of electrodes 61 included in the probe 60. The holding units 22 are made of resin as a material. The thickness of the plurality of holding units 22 is set at a dimension corresponding to the entire length of each of the measuring objects 50 having different sizes.
【課題】オープン補正およびショート補正のような補正を行う場合において、精度の高い補正値を得ることが可能な補正用治具を提供する。【解決手段】インピーダンス測定器に接続されるプローブ６０を介して、被測定物５０のインピーダンス測定における誤差を低減するための補正を行う際に用いられる補正用治具１０であり、プローブ６０が備える一対の電極６１によって挟み込まれる複数の挟持部２２を備え、この挟持部２２は、樹脂を材質として形成され、複数の挟持部２２の厚みは、サイズの異なる被測定物５０のそれぞれの全長に対応する寸法に設定されている。【選択図】図１</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2015</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAO8ff3UXDzD1Jw9g8KcnUO8fT342FgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaGpgZGhuZGFo7GRCkCAJdzHsM</recordid><startdate>20150202</startdate><enddate>20150202</enddate><creator>YAMAKOSHI HIDETO</creator><scope>EVB</scope></search><sort><creationdate>20150202</creationdate><title>TOOL FOR CORRECTION</title><author>YAMAKOSHI HIDETO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2015021728A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; jpn</language><creationdate>2015</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YAMAKOSHI HIDETO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAMAKOSHI HIDETO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TOOL FOR CORRECTION</title><date>2015-02-02</date><risdate>2015</risdate><abstract>PROBLEM TO BE SOLVED: To provide a tool for correction allowing an accurate correction value to be obtained when correction such as open correction and short correction is performed.SOLUTION: A tool 10 for correction is used in performing correction for reducing an error in impedance measurement of measuring objects 50 via a probe 60 connected to an impedance measuring instrument. The tool 10 for correction includes a plurality of holding units 22 sandwiched between a pair of electrodes 61 included in the probe 60. The holding units 22 are made of resin as a material. The thickness of the plurality of holding units 22 is set at a dimension corresponding to the entire length of each of the measuring objects 50 having different sizes.
【課題】オープン補正およびショート補正のような補正を行う場合において、精度の高い補正値を得ることが可能な補正用治具を提供する。【解決手段】インピーダンス測定器に接続されるプローブ６０を介して、被測定物５０のインピーダンス測定における誤差を低減するための補正を行う際に用いられる補正用治具１０であり、プローブ６０が備える一対の電極６１によって挟み込まれる複数の挟持部２２を備え、この挟持部２２は、樹脂を材質として形成され、複数の挟持部２２の厚みは、サイズの異なる被測定物５０のそれぞれの全長に対応する寸法に設定されている。【選択図】図１</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | TOOL FOR CORRECTION |
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