THREE-DIMENSIONAL MEASURING METHOD AND THREE-DIMENSIONAL MEASURING SYSTEM

PROBLEM TO BE SOLVED: To provide a three-dimensional measuring method and a three-dimensional measuring system for measuring a three-dimensional shape of a target by measuring the distance to the target capable of easily performing geometric calibration processing.SOLUTION: The three-dimensional mea...

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1. Verfasser:	SUZUKA TETSUYA
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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creator	SUZUKA TETSUYA
description	PROBLEM TO BE SOLVED: To provide a three-dimensional measuring method and a three-dimensional measuring system for measuring a three-dimensional shape of a target by measuring the distance to the target capable of easily performing geometric calibration processing.SOLUTION: The three-dimensional measuring method includes the steps of: measuring a distance to a group of a flat surface 12 at a position of which is given as a flat surface equation 72 (step 33); calculating an estimation distance 55 to the flat surface based on a calibration parameter 80 and the flat surface equation 72 (step 51); and updating the calibration parameter 80 based on a piece of difference information 56 between a measured distance 62 and the estimation distance 55 (step 52b).
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subjects	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	THREE-DIMENSIONAL MEASURING METHOD AND THREE-DIMENSIONAL MEASURING SYSTEM
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