HETEROJUNCTION BIPOLAR TRANSISTOR

PROBLEM TO BE SOLVED: To enable inhibition of inter-valley scattering that leads to performance deterioration of a heterojunction bipolar transistor in a state capable of practical manufacturing.SOLUTION: A heterojunction bipolar transistor comprises a third collector layer 123 which is formed betwe...

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Hauptverfasser: KURISHIMA KENJI, KAYAO NORIHIDE, IDA MINORU
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creator KURISHIMA KENJI
KAYAO NORIHIDE
IDA MINORU
description PROBLEM TO BE SOLVED: To enable inhibition of inter-valley scattering that leads to performance deterioration of a heterojunction bipolar transistor in a state capable of practical manufacturing.SOLUTION: A heterojunction bipolar transistor comprises a third collector layer 123 which is formed between a first collector layer 121 and a second collector layer 122 and composed of a group III-V compound semiconductor. Here, conduction band edge energy of the third collector layer 123 is set smaller than conduction band edge energy of the first collector layer 121 at a junction interface between the first collector layer 121 and the third collector layer 123. At the same time, conduction band edge energy of the third collector layer 123 is set smaller than conduction band edge energy of the second collector layer 122 at a junction interface between the second collector layer 122 and the third collector layer 123.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2014123642A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2014123642A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2014123642A3</originalsourceid><addsrcrecordid>eNrjZFD0cA1xDfL3CvVzDvH091Nw8gzw93EMUggJcvQL9gwO8Q_iYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBoYmhkbGZiZGjsZEKQIAh24jAQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>HETEROJUNCTION BIPOLAR TRANSISTOR</title><source>esp@cenet</source><creator>KURISHIMA KENJI ; KAYAO NORIHIDE ; IDA MINORU</creator><creatorcontrib>KURISHIMA KENJI ; KAYAO NORIHIDE ; IDA MINORU</creatorcontrib><description>PROBLEM TO BE SOLVED: To enable inhibition of inter-valley scattering that leads to performance deterioration of a heterojunction bipolar transistor in a state capable of practical manufacturing.SOLUTION: A heterojunction bipolar transistor comprises a third collector layer 123 which is formed between a first collector layer 121 and a second collector layer 122 and composed of a group III-V compound semiconductor. Here, conduction band edge energy of the third collector layer 123 is set smaller than conduction band edge energy of the first collector layer 121 at a junction interface between the first collector layer 121 and the third collector layer 123. At the same time, conduction band edge energy of the third collector layer 123 is set smaller than conduction band edge energy of the second collector layer 122 at a junction interface between the second collector layer 122 and the third collector layer 123.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140703&amp;DB=EPODOC&amp;CC=JP&amp;NR=2014123642A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140703&amp;DB=EPODOC&amp;CC=JP&amp;NR=2014123642A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KURISHIMA KENJI</creatorcontrib><creatorcontrib>KAYAO NORIHIDE</creatorcontrib><creatorcontrib>IDA MINORU</creatorcontrib><title>HETEROJUNCTION BIPOLAR TRANSISTOR</title><description>PROBLEM TO BE SOLVED: To enable inhibition of inter-valley scattering that leads to performance deterioration of a heterojunction bipolar transistor in a state capable of practical manufacturing.SOLUTION: A heterojunction bipolar transistor comprises a third collector layer 123 which is formed between a first collector layer 121 and a second collector layer 122 and composed of a group III-V compound semiconductor. Here, conduction band edge energy of the third collector layer 123 is set smaller than conduction band edge energy of the first collector layer 121 at a junction interface between the first collector layer 121 and the third collector layer 123. At the same time, conduction band edge energy of the third collector layer 123 is set smaller than conduction band edge energy of the second collector layer 122 at a junction interface between the second collector layer 122 and the third collector layer 123.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD0cA1xDfL3CvVzDvH091Nw8gzw93EMUggJcvQL9gwO8Q_iYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBoYmhkbGZiZGjsZEKQIAh24jAQ</recordid><startdate>20140703</startdate><enddate>20140703</enddate><creator>KURISHIMA KENJI</creator><creator>KAYAO NORIHIDE</creator><creator>IDA MINORU</creator><scope>EVB</scope></search><sort><creationdate>20140703</creationdate><title>HETEROJUNCTION BIPOLAR TRANSISTOR</title><author>KURISHIMA KENJI ; KAYAO NORIHIDE ; IDA MINORU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2014123642A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>KURISHIMA KENJI</creatorcontrib><creatorcontrib>KAYAO NORIHIDE</creatorcontrib><creatorcontrib>IDA MINORU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KURISHIMA KENJI</au><au>KAYAO NORIHIDE</au><au>IDA MINORU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>HETEROJUNCTION BIPOLAR TRANSISTOR</title><date>2014-07-03</date><risdate>2014</risdate><abstract>PROBLEM TO BE SOLVED: To enable inhibition of inter-valley scattering that leads to performance deterioration of a heterojunction bipolar transistor in a state capable of practical manufacturing.SOLUTION: A heterojunction bipolar transistor comprises a third collector layer 123 which is formed between a first collector layer 121 and a second collector layer 122 and composed of a group III-V compound semiconductor. Here, conduction band edge energy of the third collector layer 123 is set smaller than conduction band edge energy of the first collector layer 121 at a junction interface between the first collector layer 121 and the third collector layer 123. At the same time, conduction band edge energy of the third collector layer 123 is set smaller than conduction band edge energy of the second collector layer 122 at a junction interface between the second collector layer 122 and the third collector layer 123.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title HETEROJUNCTION BIPOLAR TRANSISTOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T17%3A50%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KURISHIMA%20KENJI&rft.date=2014-07-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2014123642A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true