DYNAMIC FOCAL SHIFT TYPE OPTICAL INTERFERENCE TOMOGRAPHIC MICROSCOPE
PROBLEM TO BE SOLVED: To provide a dynamic focal shift type optical interference tomographic microscope which is high-resolution, high-speed and inexpensive and uses an optical interference tomographic method.SOLUTION: A laser light whose wavelength is swept enters a single-mode fiber 101. The incid...
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| creator | OKABE YUICHI OMI MASAHITO YAGI IKUTAKE IMAI KANEYUKI HARUNA MASAMITSU |
| description | PROBLEM TO BE SOLVED: To provide a dynamic focal shift type optical interference tomographic microscope which is high-resolution, high-speed and inexpensive and uses an optical interference tomographic method.SOLUTION: A laser light whose wavelength is swept enters a single-mode fiber 101. The incident light is divided by a fiber coupler 102, and one moves toward an object to be measured 120 while the other is reflected by a mirror 108 as a reference light. The light reflected in the object to be measured 120 passes through a lens 105, a variable-focal length lens 104 and a lens 103 and is reconnected to the single-mode fiber 101. At that time, an incident position of the single-mode fiber and a focal point within the object to be measured are confocal, and only a reflected light from a focal position out of all the reflected lights from the inside of the object to be measured 120 is reconnected to the single-mode fiber 101. The focal position can be changed with the use of the variable-focal length lens 104, and reflectance distribution in a depth direction can be obtained. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2014115161A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2014115161A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2014115161A3</originalsourceid><addsrcrecordid>eNrjZHBxifRz9PV0VnDzd3b0UQj28HQLUQiJDHBV8A8I8QQJefqFuAa5uQa5-jm7KoT4-_q7BzkGeAB1AHUF-Qc7-we48jCwpiXmFKfyQmluBiU31xBnD93Ugvz41OKCxOTUvNSSeK8AIwNDE0NDU0MzQ0djohQBALs7LEw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DYNAMIC FOCAL SHIFT TYPE OPTICAL INTERFERENCE TOMOGRAPHIC MICROSCOPE</title><source>esp@cenet</source><creator>OKABE YUICHI ; OMI MASAHITO ; YAGI IKUTAKE ; IMAI KANEYUKI ; HARUNA MASAMITSU</creator><creatorcontrib>OKABE YUICHI ; OMI MASAHITO ; YAGI IKUTAKE ; IMAI KANEYUKI ; HARUNA MASAMITSU</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a dynamic focal shift type optical interference tomographic microscope which is high-resolution, high-speed and inexpensive and uses an optical interference tomographic method.SOLUTION: A laser light whose wavelength is swept enters a single-mode fiber 101. The incident light is divided by a fiber coupler 102, and one moves toward an object to be measured 120 while the other is reflected by a mirror 108 as a reference light. The light reflected in the object to be measured 120 passes through a lens 105, a variable-focal length lens 104 and a lens 103 and is reconnected to the single-mode fiber 101. At that time, an incident position of the single-mode fiber and a focal point within the object to be measured are confocal, and only a reflected light from a focal position out of all the reflected lights from the inside of the object to be measured 120 is reconnected to the single-mode fiber 101. The focal position can be changed with the use of the variable-focal length lens 104, and reflectance distribution in a depth direction can be obtained.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140626&DB=EPODOC&CC=JP&NR=2014115161A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140626&DB=EPODOC&CC=JP&NR=2014115161A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OKABE YUICHI</creatorcontrib><creatorcontrib>OMI MASAHITO</creatorcontrib><creatorcontrib>YAGI IKUTAKE</creatorcontrib><creatorcontrib>IMAI KANEYUKI</creatorcontrib><creatorcontrib>HARUNA MASAMITSU</creatorcontrib><title>DYNAMIC FOCAL SHIFT TYPE OPTICAL INTERFERENCE TOMOGRAPHIC MICROSCOPE</title><description>PROBLEM TO BE SOLVED: To provide a dynamic focal shift type optical interference tomographic microscope which is high-resolution, high-speed and inexpensive and uses an optical interference tomographic method.SOLUTION: A laser light whose wavelength is swept enters a single-mode fiber 101. The incident light is divided by a fiber coupler 102, and one moves toward an object to be measured 120 while the other is reflected by a mirror 108 as a reference light. The light reflected in the object to be measured 120 passes through a lens 105, a variable-focal length lens 104 and a lens 103 and is reconnected to the single-mode fiber 101. At that time, an incident position of the single-mode fiber and a focal point within the object to be measured are confocal, and only a reflected light from a focal position out of all the reflected lights from the inside of the object to be measured 120 is reconnected to the single-mode fiber 101. The focal position can be changed with the use of the variable-focal length lens 104, and reflectance distribution in a depth direction can be obtained.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHBxifRz9PV0VnDzd3b0UQj28HQLUQiJDHBV8A8I8QQJefqFuAa5uQa5-jm7KoT4-_q7BzkGeAB1AHUF-Qc7-we48jCwpiXmFKfyQmluBiU31xBnD93Ugvz41OKCxOTUvNSSeK8AIwNDE0NDU0MzQ0djohQBALs7LEw</recordid><startdate>20140626</startdate><enddate>20140626</enddate><creator>OKABE YUICHI</creator><creator>OMI MASAHITO</creator><creator>YAGI IKUTAKE</creator><creator>IMAI KANEYUKI</creator><creator>HARUNA MASAMITSU</creator><scope>EVB</scope></search><sort><creationdate>20140626</creationdate><title>DYNAMIC FOCAL SHIFT TYPE OPTICAL INTERFERENCE TOMOGRAPHIC MICROSCOPE</title><author>OKABE YUICHI ; OMI MASAHITO ; YAGI IKUTAKE ; IMAI KANEYUKI ; HARUNA MASAMITSU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2014115161A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OKABE YUICHI</creatorcontrib><creatorcontrib>OMI MASAHITO</creatorcontrib><creatorcontrib>YAGI IKUTAKE</creatorcontrib><creatorcontrib>IMAI KANEYUKI</creatorcontrib><creatorcontrib>HARUNA MASAMITSU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OKABE YUICHI</au><au>OMI MASAHITO</au><au>YAGI IKUTAKE</au><au>IMAI KANEYUKI</au><au>HARUNA MASAMITSU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DYNAMIC FOCAL SHIFT TYPE OPTICAL INTERFERENCE TOMOGRAPHIC MICROSCOPE</title><date>2014-06-26</date><risdate>2014</risdate><abstract>PROBLEM TO BE SOLVED: To provide a dynamic focal shift type optical interference tomographic microscope which is high-resolution, high-speed and inexpensive and uses an optical interference tomographic method.SOLUTION: A laser light whose wavelength is swept enters a single-mode fiber 101. The incident light is divided by a fiber coupler 102, and one moves toward an object to be measured 120 while the other is reflected by a mirror 108 as a reference light. The light reflected in the object to be measured 120 passes through a lens 105, a variable-focal length lens 104 and a lens 103 and is reconnected to the single-mode fiber 101. At that time, an incident position of the single-mode fiber and a focal point within the object to be measured are confocal, and only a reflected light from a focal position out of all the reflected lights from the inside of the object to be measured 120 is reconnected to the single-mode fiber 101. The focal position can be changed with the use of the variable-focal length lens 104, and reflectance distribution in a depth direction can be obtained.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | DYNAMIC FOCAL SHIFT TYPE OPTICAL INTERFERENCE TOMOGRAPHIC MICROSCOPE |
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