LUMINESCENCE DETECTION WORKSTATION

PROBLEM TO BE SOLVED: To provide a luminescence detecting apparatus which enables improved reliability of analyzed data by enabling high speed processing that simultaneously screens many samples without crosstalk interference from adjacent samples.SOLUTION: The luminescence detecting apparatus is an...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WON YONG-DONG, GEORGE SABAK, ISRAEL METAL, JEFF LEVI, JOHN C VOYTA, MICHAEL R GAMBINI, JOHN ATWOOD, BRUCE E DESIMAS II, EDWARD LAKATOS
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator WON YONG-DONG
GEORGE SABAK
ISRAEL METAL
JEFF LEVI
JOHN C VOYTA
MICHAEL R GAMBINI
JOHN ATWOOD
BRUCE E DESIMAS II
EDWARD LAKATOS
description PROBLEM TO BE SOLVED: To provide a luminescence detecting apparatus which enables improved reliability of analyzed data by enabling high speed processing that simultaneously screens many samples without crosstalk interference from adjacent samples.SOLUTION: The luminescence detecting apparatus is an analyzer for analyzing a plurality of luminescent samples, and comprises a chamber, which comprises a collimator 110, a Fresnel lens 120, a filter 130, and a camera lens 140. Only parallel and nearly parallel light rays are permitted to exit sample wells 20 arranged in a plate 10 for eventual imaging. A focused image is created by optics 80 on a charge-coupled device camera 70.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2014098709A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2014098709A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2014098709A3</originalsourceid><addsrcrecordid>eNrjZFDyCfX19HMNdnb1c3ZVcHENcXUO8fT3Uwj3D_IODnEEsXkYWNMSc4pTeaE0N4OSm2uIs4duakF-fGpxQWJyal5qSbxXgJGBoYmBpYW5gaWjMVGKAKFhI0w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>LUMINESCENCE DETECTION WORKSTATION</title><source>esp@cenet</source><creator>WON YONG-DONG ; GEORGE SABAK ; ISRAEL METAL ; JEFF LEVI ; JOHN C VOYTA ; MICHAEL R GAMBINI ; JOHN ATWOOD ; BRUCE E DESIMAS II ; EDWARD LAKATOS</creator><creatorcontrib>WON YONG-DONG ; GEORGE SABAK ; ISRAEL METAL ; JEFF LEVI ; JOHN C VOYTA ; MICHAEL R GAMBINI ; JOHN ATWOOD ; BRUCE E DESIMAS II ; EDWARD LAKATOS</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a luminescence detecting apparatus which enables improved reliability of analyzed data by enabling high speed processing that simultaneously screens many samples without crosstalk interference from adjacent samples.SOLUTION: The luminescence detecting apparatus is an analyzer for analyzing a plurality of luminescent samples, and comprises a chamber, which comprises a collimator 110, a Fresnel lens 120, a filter 130, and a camera lens 140. Only parallel and nearly parallel light rays are permitted to exit sample wells 20 arranged in a plate 10 for eventual imaging. A focused image is created by optics 80 on a charge-coupled device camera 70.</description><language>eng</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140529&amp;DB=EPODOC&amp;CC=JP&amp;NR=2014098709A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20140529&amp;DB=EPODOC&amp;CC=JP&amp;NR=2014098709A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WON YONG-DONG</creatorcontrib><creatorcontrib>GEORGE SABAK</creatorcontrib><creatorcontrib>ISRAEL METAL</creatorcontrib><creatorcontrib>JEFF LEVI</creatorcontrib><creatorcontrib>JOHN C VOYTA</creatorcontrib><creatorcontrib>MICHAEL R GAMBINI</creatorcontrib><creatorcontrib>JOHN ATWOOD</creatorcontrib><creatorcontrib>BRUCE E DESIMAS II</creatorcontrib><creatorcontrib>EDWARD LAKATOS</creatorcontrib><title>LUMINESCENCE DETECTION WORKSTATION</title><description>PROBLEM TO BE SOLVED: To provide a luminescence detecting apparatus which enables improved reliability of analyzed data by enabling high speed processing that simultaneously screens many samples without crosstalk interference from adjacent samples.SOLUTION: The luminescence detecting apparatus is an analyzer for analyzing a plurality of luminescent samples, and comprises a chamber, which comprises a collimator 110, a Fresnel lens 120, a filter 130, and a camera lens 140. Only parallel and nearly parallel light rays are permitted to exit sample wells 20 arranged in a plate 10 for eventual imaging. A focused image is created by optics 80 on a charge-coupled device camera 70.</description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFDyCfX19HMNdnb1c3ZVcHENcXUO8fT3Uwj3D_IODnEEsXkYWNMSc4pTeaE0N4OSm2uIs4duakF-fGpxQWJyal5qSbxXgJGBoYmBpYW5gaWjMVGKAKFhI0w</recordid><startdate>20140529</startdate><enddate>20140529</enddate><creator>WON YONG-DONG</creator><creator>GEORGE SABAK</creator><creator>ISRAEL METAL</creator><creator>JEFF LEVI</creator><creator>JOHN C VOYTA</creator><creator>MICHAEL R GAMBINI</creator><creator>JOHN ATWOOD</creator><creator>BRUCE E DESIMAS II</creator><creator>EDWARD LAKATOS</creator><scope>EVB</scope></search><sort><creationdate>20140529</creationdate><title>LUMINESCENCE DETECTION WORKSTATION</title><author>WON YONG-DONG ; GEORGE SABAK ; ISRAEL METAL ; JEFF LEVI ; JOHN C VOYTA ; MICHAEL R GAMBINI ; JOHN ATWOOD ; BRUCE E DESIMAS II ; EDWARD LAKATOS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2014098709A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WON YONG-DONG</creatorcontrib><creatorcontrib>GEORGE SABAK</creatorcontrib><creatorcontrib>ISRAEL METAL</creatorcontrib><creatorcontrib>JEFF LEVI</creatorcontrib><creatorcontrib>JOHN C VOYTA</creatorcontrib><creatorcontrib>MICHAEL R GAMBINI</creatorcontrib><creatorcontrib>JOHN ATWOOD</creatorcontrib><creatorcontrib>BRUCE E DESIMAS II</creatorcontrib><creatorcontrib>EDWARD LAKATOS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WON YONG-DONG</au><au>GEORGE SABAK</au><au>ISRAEL METAL</au><au>JEFF LEVI</au><au>JOHN C VOYTA</au><au>MICHAEL R GAMBINI</au><au>JOHN ATWOOD</au><au>BRUCE E DESIMAS II</au><au>EDWARD LAKATOS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>LUMINESCENCE DETECTION WORKSTATION</title><date>2014-05-29</date><risdate>2014</risdate><abstract>PROBLEM TO BE SOLVED: To provide a luminescence detecting apparatus which enables improved reliability of analyzed data by enabling high speed processing that simultaneously screens many samples without crosstalk interference from adjacent samples.SOLUTION: The luminescence detecting apparatus is an analyzer for analyzing a plurality of luminescent samples, and comprises a chamber, which comprises a collimator 110, a Fresnel lens 120, a filter 130, and a camera lens 140. Only parallel and nearly parallel light rays are permitted to exit sample wells 20 arranged in a plate 10 for eventual imaging. A focused image is created by optics 80 on a charge-coupled device camera 70.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2014098709A
source esp@cenet
subjects COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
title LUMINESCENCE DETECTION WORKSTATION
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-16T01%3A45%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WON%20YONG-DONG&rft.date=2014-05-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2014098709A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true