APPARATUS FOR MEASURING DRYING RATE AND METHOD FOR MEASURING DRYING RATE USING THE SAME

PROBLEM TO BE SOLVED: To provide an apparatus for measuring a drying rate and a method for measuring a drying rate using the same in order to measure the drying rate of a substrate material in manufacturing an electronic apparatus.SOLUTION: The apparatus for measuring a drying rate may include a sup...

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Bibliographische Detailangaben
Hauptverfasser:	SHIN DONG JOO, KIM SUNG HYUN, CHUN HEE SUN, JANG JUNG YONG, LEE CHOON KEUN, CHO JAE CHOON
Format:	Patent
Sprache:	eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING PHYSICS PRINTED CIRCUITS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an apparatus for measuring a drying rate and a method for measuring a drying rate using the same in order to measure the drying rate of a substrate material in manufacturing an electronic apparatus.SOLUTION: The apparatus for measuring a drying rate may include a support part having a substrate seated thereon; and a marking part disposed above the substrate while being vertically and horizontally movable, and forming a marking on the substrate while being in contact with the substrate.