TEST DEVICE FOR ELECTRONIC COMPONENT ELEMENT

PROBLEM TO BE SOLVED: To form a test device for electronic component elements molded on a substrate so as to perform a number of test steps during manufacturing of the component elements on the substrate without damaging the substrate, component elements, and/or connections between the substrate and...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	BERNHARD LORENZ
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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