A/D CONVERTER INSPECTION APPARATUS AND A/D CONVERTER INSPECTION METHOD
PROBLEM TO BE SOLVED: To execute an entire inspection of an entire A/D converter and a partial inspection of the A/D converter.SOLUTION: An A/D converter inspection apparatus includes: a signal output section 22 for outputting an inspectional analog signal Ste and an inspectional digital signal Dte...
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creator | KOIKE SHINICHI |
description | PROBLEM TO BE SOLVED: To execute an entire inspection of an entire A/D converter and a partial inspection of the A/D converter.SOLUTION: An A/D converter inspection apparatus includes: a signal output section 22 for outputting an inspectional analog signal Ste and an inspectional digital signal Dte (inspectional signals); and a processing section 24 for executing an entire inspection process of computing a characteristic value Dcha1 (overflow occurrence frequency and noise floor level) of an entire A/D converter 1 on the basis of a digital signal D2 (inspection output signal) output from a digital filter section 4 upon the input of the inspectional analog signal Ste to an analog signal adjustment section 2, and inspecting the entire A/D converter 1 on the basis of the computed characteristic value Dcha1, and a partial inspection process of inspecting one component (one of analog signal adjustment section 2, modulation section 3 and digital filter section 4) on the basis of an inspection output signal that is a signal output from the one component upon the input of the inspectional signals to the one component. |
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and a processing section 24 for executing an entire inspection process of computing a characteristic value Dcha1 (overflow occurrence frequency and noise floor level) of an entire A/D converter 1 on the basis of a digital signal D2 (inspection output signal) output from a digital filter section 4 upon the input of the inspectional analog signal Ste to an analog signal adjustment section 2, and inspecting the entire A/D converter 1 on the basis of the computed characteristic value Dcha1, and a partial inspection process of inspecting one component (one of analog signal adjustment section 2, modulation section 3 and digital filter section 4) on the basis of an inspection output signal that is a signal output from the one component upon the input of the inspectional signals to the one component.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CODE CONVERSION IN GENERAL ; CODING ; DECODING ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; 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and a processing section 24 for executing an entire inspection process of computing a characteristic value Dcha1 (overflow occurrence frequency and noise floor level) of an entire A/D converter 1 on the basis of a digital signal D2 (inspection output signal) output from a digital filter section 4 upon the input of the inspectional analog signal Ste to an analog signal adjustment section 2, and inspecting the entire A/D converter 1 on the basis of the computed characteristic value Dcha1, and a partial inspection process of inspecting one component (one of analog signal adjustment section 2, modulation section 3 and digital filter section 4) on the basis of an inspection output signal that is a signal output from the one component upon the input of the inspectional signals to the one component.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>DECODING</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHBz1HdRcPb3C3MNCnENUvD0Cw5wdQ7x9PdTcAwIcAxyDAkNVnD0c1HAqczXNcTD34WHgTUtMac4lRdKczMoubmGOHvophbkx6cWFyQmp-allsR7BRgZGBobmhoYWJg7GhOlCAD7JCys</recordid><startdate>20130801</startdate><enddate>20130801</enddate><creator>KOIKE SHINICHI</creator><scope>EVB</scope></search><sort><creationdate>20130801</creationdate><title>A/D CONVERTER INSPECTION APPARATUS AND A/D CONVERTER INSPECTION METHOD</title><author>KOIKE SHINICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2013150087A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>DECODING</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KOIKE SHINICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KOIKE SHINICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>A/D CONVERTER INSPECTION APPARATUS AND A/D CONVERTER INSPECTION METHOD</title><date>2013-08-01</date><risdate>2013</risdate><abstract>PROBLEM TO BE SOLVED: To execute an entire inspection of an entire A/D converter and a partial inspection of the A/D converter.SOLUTION: An A/D converter inspection apparatus includes: a signal output section 22 for outputting an inspectional analog signal Ste and an inspectional digital signal Dte (inspectional signals); 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subjects | BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING DECODING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | A/D CONVERTER INSPECTION APPARATUS AND A/D CONVERTER INSPECTION METHOD |
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