TOMOGRAPH

PROBLEM TO BE SOLVED: To provide a tomograph that can easily align an inspection domain of an analyte with an axis of rotation or includes a compact and simple mechanism for aligning the inspection domain of the analyte with the axis of rotation.SOLUTION: The tomograph includes: a turntable 7 having...

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Hauptverfasser:	UYAMA KIICHIRO, HANKO SHUICHI, KURIHARA NORIKAZU
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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creator	UYAMA KIICHIRO HANKO SHUICHI KURIHARA NORIKAZU
description	PROBLEM TO BE SOLVED: To provide a tomograph that can easily align an inspection domain of an analyte with an axis of rotation or includes a compact and simple mechanism for aligning the inspection domain of the analyte with the axis of rotation.SOLUTION: The tomograph includes: a turntable 7 having a placement surface on which an analyte 4 is placed; an X-ray tube 2 which radiates an X-ray beam 5 to the analyte 4 placed on the turntable 7; an X-ray detector 6 which detects the X-ray beam 5 transmitted through the analyte 4 while having an X-ray optical axis XA in a direction tilted from a perpendicular to the placement surface, and outputs transmission data; a rotary mechanism 8 which rotates the turntable 7 on an axis RA of rotation perpendicular to the placement surface; a laser light source 14 which emits laser light having a laser optical axis LA aligned with the axis RA of rotation; and a control processing unit 16 which reconstitutes a tomographic image of the analyte 4 from the transmission data detected by the X-ray detector 6 at a plurality of positions of rotation by the rotary mechanism 8.
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an X-ray tube 2 which radiates an X-ray beam 5 to the analyte 4 placed on the turntable 7; an X-ray detector 6 which detects the X-ray beam 5 transmitted through the analyte 4 while having an X-ray optical axis XA in a direction tilted from a perpendicular to the placement surface, and outputs transmission data; a rotary mechanism 8 which rotates the turntable 7 on an axis RA of rotation perpendicular to the placement surface; a laser light source 14 which emits laser light having a laser optical axis LA aligned with the axis RA of rotation; and a control processing unit 16 which reconstitutes a tomographic image of the analyte 4 from the transmission data detected by the X-ray detector 6 at a plurality of positions of rotation by the rotary mechanism 8.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130711&DB=EPODOC&CC=JP&NR=2013137287A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130711&DB=EPODOC&CC=JP&NR=2013137287A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>UYAMA KIICHIRO</creatorcontrib><creatorcontrib>HANKO SHUICHI</creatorcontrib><creatorcontrib>KURIHARA NORIKAZU</creatorcontrib><title>TOMOGRAPH</title><description>PROBLEM TO BE SOLVED: To provide a tomograph that can easily align an inspection domain of an analyte with an axis of rotation or includes a compact and simple mechanism for aligning the inspection domain of the analyte with the axis of rotation.SOLUTION: The tomograph includes: a turntable 7 having a placement surface on which an analyte 4 is placed; 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subjects	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
title	TOMOGRAPH
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