DISPLACEMENT MEASURING METHOD AND DISPLACEMENT MEASURING APPARATUS

PROBLEM TO BE SOLVED: To provide a displacement measuring method and a displacement measuring apparatus in which accuracy of displacement measurement is improved by performing centroid position calculation without being influenced by a pixel having particular luminance.SOLUTION: A displacement measu...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SHIRAISHI TADAMICHI, HORI TOMOMI, IMAGAWA TAKESHI
Format: Patent
Sprache:eng
Schlagworte:
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