MARK DETECTION METHOD
PROBLEM TO BE SOLVED: To provide a mark detection method capable of accurately detecting an edge of a mark being a detection object.SOLUTION: The mark detection method includes: a step of differentiating a two-dimensional image including linear marks extending in a Y direction, in an X direction and...
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| creator | UEDA TAKUHIKO YONETANI MASAHIRO |
| description | PROBLEM TO BE SOLVED: To provide a mark detection method capable of accurately detecting an edge of a mark being a detection object.SOLUTION: The mark detection method includes: a step of differentiating a two-dimensional image including linear marks extending in a Y direction, in an X direction and then performing projective addition in the Y direction; a number-of-edges detection step of detecting the number of edges present in the Y direction during the projective addition, for each region in the X direction; an addition value correction step of reducing an addition value for each region in the X direction after the projective addition in the case that the number of edges for each region in the X direction, which has been detected in the number-of-edges detection step, is equal to or smaller than a set value; and an edge detection step of detecting edges of the linear marks on the basis of the addition values for respective regions in the X direction after the projective addition, which have been corrected in the addition value correction step. |
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a number-of-edges detection step of detecting the number of edges present in the Y direction during the projective addition, for each region in the X direction; an addition value correction step of reducing an addition value for each region in the X direction after the projective addition in the case that the number of edges for each region in the X direction, which has been detected in the number-of-edges detection step, is equal to or smaller than a set value; and an edge detection step of detecting edges of the linear marks on the basis of the addition values for respective regions in the X direction after the projective addition, which have been corrected in the addition value correction step.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130513&DB=EPODOC&CC=JP&NR=2013088836A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130513&DB=EPODOC&CC=JP&NR=2013088836A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>UEDA TAKUHIKO</creatorcontrib><creatorcontrib>YONETANI MASAHIRO</creatorcontrib><title>MARK DETECTION METHOD</title><description>PROBLEM TO BE SOLVED: To provide a mark detection method capable of accurately detecting an edge of a mark being a detection object.SOLUTION: The mark detection method includes: a step of differentiating a two-dimensional image including linear marks extending in a Y direction, in an X direction and then performing projective addition in the Y direction; a number-of-edges detection step of detecting the number of edges present in the Y direction during the projective addition, for each region in the X direction; an addition value correction step of reducing an addition value for each region in the X direction after the projective addition in the case that the number of edges for each region in the X direction, which has been detected in the number-of-edges detection step, is equal to or smaller than a set value; and an edge detection step of detecting edges of the linear marks on the basis of the addition values for respective regions in the X direction after the projective addition, which have been corrected in the addition value correction step.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBD1dQzyVnBxDXF1DvH091PwdQ3x8HfhYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBobGBhYWFsZmjsZEKQIAy5IfSQ</recordid><startdate>20130513</startdate><enddate>20130513</enddate><creator>UEDA TAKUHIKO</creator><creator>YONETANI MASAHIRO</creator><scope>EVB</scope></search><sort><creationdate>20130513</creationdate><title>MARK DETECTION METHOD</title><author>UEDA TAKUHIKO ; 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| subjects | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS SEMICONDUCTOR DEVICES |
| title | MARK DETECTION METHOD |
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