SEMICONDUCTOR DEVICE AND TEMPERATURE SENSOR SYSTEM

PROBLEM TO BE SOLVED: To suppress the increase of the number of voltage comparators accompanying the increase of a chip temperature detection range.SOLUTION: A temperature sensor (4) of a semiconductor (200) includes a temperature detection circuit (46) for outputting voltage according to a chip tem...

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Bibliographische Detailangaben
Hauptverfasser: NARUSE MINENOBU, KAMEYAMA SADAFUMI, ITO TAKAYASU
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To suppress the increase of the number of voltage comparators accompanying the increase of a chip temperature detection range.SOLUTION: A temperature sensor (4) of a semiconductor (200) includes a temperature detection circuit (46) for outputting voltage according to a chip temperature, a reference voltage forming circuit (50) for forming a plurality of reference voltages, and a plurality of voltage comparators (53 to 56) for comparing the output voltage of the temperature detection circuit with each reference voltage to form a chip temperature detection signal of a plurality of bits. The temperature sensor includes a control circuit (45) capable of shifting a chip temperature detection range by controlling the reference voltage on the basis of the chip detection signal to change correspondence between the chip temperature detection signal and the chip temperature. The increase of the chip temperature detection range, which necessitates changing of only the correspondence between the chip detection signal and the chip temperature, is not accompanied by the increase of the number of voltage comparators.