EFFECTIVE VALUE MEASURING INSTRUMENT

PROBLEM TO BE SOLVED: To provide an effective value measuring instrument capable of more accurately measuring an effective value with respect to a measurement object signal having an unknown frequency.SOLUTION: The effective value measuring instrument includes: a windowing processing unit 12 which s...

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1. Verfasser:	KOIKE SHINICHI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	KOIKE SHINICHI
description	PROBLEM TO BE SOLVED: To provide an effective value measuring instrument capable of more accurately measuring an effective value with respect to a measurement object signal having an unknown frequency.SOLUTION: The effective value measuring instrument includes: a windowing processing unit 12 which subjects a prescribed number N of pieces of sampling data D1 (data D2) about a measurement object signal S1 to windowing processing to output window data D3; a squaring processing unit 13 which squares the window data D3 to output squared data D4; an averaging processing unit 15 which averages a prescribed number N of pieces of the squared data D4 to output average data D6; a square root calculation unit 16 which calculates a square root of the average data D6 to output square root data D7; and a correction unit 17 which corrects the square root data D7 by attenuation at the time of windowing processing to output an effective value Drms of the measurement object signal S1.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2013040962A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2013040962A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2013040962A3</originalsourceid><addsrcrecordid>eNrjZFBxdXNzdQ7xDHNVCHP0CXVV8HV1DA4N8vRzV_D0Cw4JCvV19QvhYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBobGBiYGlmZGjsZEKQIA2Fojpw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>EFFECTIVE VALUE MEASURING INSTRUMENT</title><source>esp@cenet</source><creator>KOIKE SHINICHI</creator><creatorcontrib>KOIKE SHINICHI</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide an effective value measuring instrument capable of more accurately measuring an effective value with respect to a measurement object signal having an unknown frequency.SOLUTION: The effective value measuring instrument includes: a windowing processing unit 12 which subjects a prescribed number N of pieces of sampling data D1 (data D2) about a measurement object signal S1 to windowing processing to output window data D3; a squaring processing unit 13 which squares the window data D3 to output squared data D4; an averaging processing unit 15 which averages a prescribed number N of pieces of the squared data D4 to output average data D6; a square root calculation unit 16 which calculates a square root of the average data D6 to output square root data D7; and a correction unit 17 which corrects the square root data D7 by attenuation at the time of windowing processing to output an effective value Drms of the measurement object signal S1.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130228&DB=EPODOC&CC=JP&NR=2013040962A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130228&DB=EPODOC&CC=JP&NR=2013040962A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KOIKE SHINICHI</creatorcontrib><title>EFFECTIVE VALUE MEASURING INSTRUMENT</title><description>PROBLEM TO BE SOLVED: To provide an effective value measuring instrument capable of more accurately measuring an effective value with respect to a measurement object signal having an unknown frequency.SOLUTION: The effective value measuring instrument includes: a windowing processing unit 12 which subjects a prescribed number N of pieces of sampling data D1 (data D2) about a measurement object signal S1 to windowing processing to output window data D3; a squaring processing unit 13 which squares the window data D3 to output squared data D4; an averaging processing unit 15 which averages a prescribed number N of pieces of the squared data D4 to output average data D6; a square root calculation unit 16 which calculates a square root of the average data D6 to output square root data D7; and a correction unit 17 which corrects the square root data D7 by attenuation at the time of windowing processing to output an effective value Drms of the measurement object signal S1.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBxdXNzdQ7xDHNVCHP0CXVV8HV1DA4N8vRzV_D0Cw4JCvV19QvhYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBobGBiYGlmZGjsZEKQIA2Fojpw</recordid><startdate>20130228</startdate><enddate>20130228</enddate><creator>KOIKE SHINICHI</creator><scope>EVB</scope></search><sort><creationdate>20130228</creationdate><title>EFFECTIVE VALUE MEASURING INSTRUMENT</title><author>KOIKE SHINICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2013040962A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KOIKE SHINICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KOIKE SHINICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>EFFECTIVE VALUE MEASURING INSTRUMENT</title><date>2013-02-28</date><risdate>2013</risdate><abstract>PROBLEM TO BE SOLVED: To provide an effective value measuring instrument capable of more accurately measuring an effective value with respect to a measurement object signal having an unknown frequency.SOLUTION: The effective value measuring instrument includes: a windowing processing unit 12 which subjects a prescribed number N of pieces of sampling data D1 (data D2) about a measurement object signal S1 to windowing processing to output window data D3; a squaring processing unit 13 which squares the window data D3 to output squared data D4; an averaging processing unit 15 which averages a prescribed number N of pieces of the squared data D4 to output average data D6; a square root calculation unit 16 which calculates a square root of the average data D6 to output square root data D7; and a correction unit 17 which corrects the square root data D7 by attenuation at the time of windowing processing to output an effective value Drms of the measurement object signal S1.</abstract><oa>free_for_read</oa></addata></record>
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subjects	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	EFFECTIVE VALUE MEASURING INSTRUMENT
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T20%3A43%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KOIKE%20SHINICHI&rft.date=2013-02-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2013040962A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true