DEVICE AND METHOD FOR INSPECTING ANODIZED ALUMINA, AND MANUFACTURING METHOD OF COMPONENT HAVING ANODIZED ALUMINA SURFACE

PROBLEM TO BE SOLVED: To provide a device and method for easily inspecting the state (shape of fine rugged structure, flaws, and the like) of anodized alumina, and a manufacturing method of a component having an anodized alumina surface with reduced unevenness in the shape of fine rugged structure a...

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Hauptverfasser:	FUKUYAMA MITSUFUMI, MATSUBARA YUJI, ISHIMARU TERUHIRO
Format:	Patent
Sprache:	eng
Schlagworte:	APPARATUS THEREFOR CHEMISTRY ELECTROFORMING ELECTROLYTIC OR ELECTROPHORETIC PROCESSES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS METALLURGY PHYSICS PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS TESTING
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creator	FUKUYAMA MITSUFUMI MATSUBARA YUJI ISHIMARU TERUHIRO
description	PROBLEM TO BE SOLVED: To provide a device and method for easily inspecting the state (shape of fine rugged structure, flaws, and the like) of anodized alumina, and a manufacturing method of a component having an anodized alumina surface with reduced unevenness in the shape of fine rugged structure and surface flaws.SOLUTION: An inspection device is used, comprising a linear lighting device 10 (first lighting means) which allows a mold 100 to be irradiated with light; a color line CCD camera 12 (first imaging means) which images light reflected by the anodized alumina of the mold 100; a linear lighting device 20 (second lighting means) which allows the mold 100 to be irradiated with light; a monochrome line CCD camera 22 (second imaging means) which images light reflected by the anodized alumina of the mold 100; and an image processing device 30 (image processing means) which determines quality of the anodized alumina on the basis of the color data and brightness data obtained from the images taken by the two cameras.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2012255652A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2012255652A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2012255652A3</originalsourceid><addsrcrecordid>eNqNy7EKwjAUheEuDqK-w8VZQSN1vyQ3NmJvQpp0cClF4iRaqIOPb8WODk5nOP83zV6KaiMJkBWUFAqrQFsPhitHMhg-DI9V5kwK8BRLw7j6tshRowzRf5pRWg3Sls4ycYAC618cqugHSPNscm1vfVqMO8uWmoIs1ql7NKnv2ku6p2dzdGKzFSLP97nA3V_RG8_fOho</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DEVICE AND METHOD FOR INSPECTING ANODIZED ALUMINA, AND MANUFACTURING METHOD OF COMPONENT HAVING ANODIZED ALUMINA SURFACE</title><source>esp@cenet</source><creator>FUKUYAMA MITSUFUMI ; MATSUBARA YUJI ; ISHIMARU TERUHIRO</creator><creatorcontrib>FUKUYAMA MITSUFUMI ; MATSUBARA YUJI ; ISHIMARU TERUHIRO</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a device and method for easily inspecting the state (shape of fine rugged structure, flaws, and the like) of anodized alumina, and a manufacturing method of a component having an anodized alumina surface with reduced unevenness in the shape of fine rugged structure and surface flaws.SOLUTION: An inspection device is used, comprising a linear lighting device 10 (first lighting means) which allows a mold 100 to be irradiated with light; a color line CCD camera 12 (first imaging means) which images light reflected by the anodized alumina of the mold 100; a linear lighting device 20 (second lighting means) which allows the mold 100 to be irradiated with light; a monochrome line CCD camera 22 (second imaging means) which images light reflected by the anodized alumina of the mold 100; and an image processing device 30 (image processing means) which determines quality of the anodized alumina on the basis of the color data and brightness data obtained from the images taken by the two cameras.</description><language>eng</language><subject>APPARATUS THEREFOR ; CHEMISTRY ; ELECTROFORMING ; ELECTROLYTIC OR ELECTROPHORETIC PROCESSES ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; METALLURGY ; PHYSICS ; PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121227&DB=EPODOC&CC=JP&NR=2012255652A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121227&DB=EPODOC&CC=JP&NR=2012255652A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FUKUYAMA MITSUFUMI</creatorcontrib><creatorcontrib>MATSUBARA YUJI</creatorcontrib><creatorcontrib>ISHIMARU TERUHIRO</creatorcontrib><title>DEVICE AND METHOD FOR INSPECTING ANODIZED ALUMINA, AND MANUFACTURING METHOD OF COMPONENT HAVING ANODIZED ALUMINA SURFACE</title><description>PROBLEM TO BE SOLVED: To provide a device and method for easily inspecting the state (shape of fine rugged structure, flaws, and the like) of anodized alumina, and a manufacturing method of a component having an anodized alumina surface with reduced unevenness in the shape of fine rugged structure and surface flaws.SOLUTION: An inspection device is used, comprising a linear lighting device 10 (first lighting means) which allows a mold 100 to be irradiated with light; a color line CCD camera 12 (first imaging means) which images light reflected by the anodized alumina of the mold 100; a linear lighting device 20 (second lighting means) which allows the mold 100 to be irradiated with light; a monochrome line CCD camera 22 (second imaging means) which images light reflected by the anodized alumina of the mold 100; and an image processing device 30 (image processing means) which determines quality of the anodized alumina on the basis of the color data and brightness data obtained from the images taken by the two cameras.</description><subject>APPARATUS THEREFOR</subject><subject>CHEMISTRY</subject><subject>ELECTROFORMING</subject><subject>ELECTROLYTIC OR ELECTROPHORETIC PROCESSES</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>METALLURGY</subject><subject>PHYSICS</subject><subject>PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNy7EKwjAUheEuDqK-w8VZQSN1vyQ3NmJvQpp0cClF4iRaqIOPb8WODk5nOP83zV6KaiMJkBWUFAqrQFsPhitHMhg-DI9V5kwK8BRLw7j6tshRowzRf5pRWg3Sls4ycYAC618cqugHSPNscm1vfVqMO8uWmoIs1ql7NKnv2ku6p2dzdGKzFSLP97nA3V_RG8_fOho</recordid><startdate>20121227</startdate><enddate>20121227</enddate><creator>FUKUYAMA MITSUFUMI</creator><creator>MATSUBARA YUJI</creator><creator>ISHIMARU TERUHIRO</creator><scope>EVB</scope></search><sort><creationdate>20121227</creationdate><title>DEVICE AND METHOD FOR INSPECTING ANODIZED ALUMINA, AND MANUFACTURING METHOD OF COMPONENT HAVING ANODIZED ALUMINA SURFACE</title><author>FUKUYAMA MITSUFUMI ; MATSUBARA YUJI ; ISHIMARU TERUHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2012255652A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><topic>APPARATUS THEREFOR</topic><topic>CHEMISTRY</topic><topic>ELECTROFORMING</topic><topic>ELECTROLYTIC OR ELECTROPHORETIC PROCESSES</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>METALLURGY</topic><topic>PHYSICS</topic><topic>PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FUKUYAMA MITSUFUMI</creatorcontrib><creatorcontrib>MATSUBARA YUJI</creatorcontrib><creatorcontrib>ISHIMARU TERUHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FUKUYAMA MITSUFUMI</au><au>MATSUBARA YUJI</au><au>ISHIMARU TERUHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE AND METHOD FOR INSPECTING ANODIZED ALUMINA, AND MANUFACTURING METHOD OF COMPONENT HAVING ANODIZED ALUMINA SURFACE</title><date>2012-12-27</date><risdate>2012</risdate><abstract>PROBLEM TO BE SOLVED: To provide a device and method for easily inspecting the state (shape of fine rugged structure, flaws, and the like) of anodized alumina, and a manufacturing method of a component having an anodized alumina surface with reduced unevenness in the shape of fine rugged structure and surface flaws.SOLUTION: An inspection device is used, comprising a linear lighting device 10 (first lighting means) which allows a mold 100 to be irradiated with light; a color line CCD camera 12 (first imaging means) which images light reflected by the anodized alumina of the mold 100; a linear lighting device 20 (second lighting means) which allows the mold 100 to be irradiated with light; a monochrome line CCD camera 22 (second imaging means) which images light reflected by the anodized alumina of the mold 100; and an image processing device 30 (image processing means) which determines quality of the anodized alumina on the basis of the color data and brightness data obtained from the images taken by the two cameras.</abstract><oa>free_for_read</oa></addata></record>
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subjects	APPARATUS THEREFOR CHEMISTRY ELECTROFORMING ELECTROLYTIC OR ELECTROPHORETIC PROCESSES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS METALLURGY PHYSICS PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS TESTING
title	DEVICE AND METHOD FOR INSPECTING ANODIZED ALUMINA, AND MANUFACTURING METHOD OF COMPONENT HAVING ANODIZED ALUMINA SURFACE
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