LEAD FRAME, SEMICONDUCTOR DEVICE HAVING THE LEAD FRAME, AND MANUFACTURING METHOD THEREFOR
PROBLEM TO BE SOLVED: To prevent the occurrence of cracks in a sealing resin while preventing the formation of resin burrs.SOLUTION: A semiconductor device has: a semiconductor chip 1; a die pad 2A having the semiconductor chip 1 fixed on the top face thereof with an adhesive member 3; a lead frame...
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creator | OTANI KATSUMI IWASE TEPPEI |
description | PROBLEM TO BE SOLVED: To prevent the occurrence of cracks in a sealing resin while preventing the formation of resin burrs.SOLUTION: A semiconductor device has: a semiconductor chip 1; a die pad 2A having the semiconductor chip 1 fixed on the top face thereof with an adhesive member 3; a lead frame 2 having leads 2B arranged around the die pad 2A and suspension leads 2C connected to the die pad 2A; thin metal wires 4 which electrically connect the semiconductor chip 1 with the leads 2B; and a sealing resin 5 which integrally seals the semiconductor chip 1, the die pad 2A, the leads 2B, the suspension leads 2C and the thin metal wires 4. A step portion 6 is provided on the peripheral part 2p of the die pad 2A. The undersurface of a part except the peripheral part 2p of the die pad 2A is exposed from the sealing resin 5. The sealing resin 5 enters the inside of the step portion 6. The depth of the step portion 6 increases from the step surface of the step portion 6 toward the side face of the die pad 2A. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2012244038A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2012244038A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2012244038A3</originalsourceid><addsrcrecordid>eNqNyrEKwjAQANAsDqL-w-GsUNMOrkdyMRGTyJkUnEqROIkW6v8jBQdHp7e8ubieCDUYRk8buJB3KgadVYoMmlqnCCy2LhwgWYLfi0GDx5ANqpR5Gp6SjXqKTCbyUszu_WMsq68LsTaUlN2W4dWVcehv5Vne3fEsq52UTVPVe6z_Sh8rDDFW</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>LEAD FRAME, SEMICONDUCTOR DEVICE HAVING THE LEAD FRAME, AND MANUFACTURING METHOD THEREFOR</title><source>esp@cenet</source><creator>OTANI KATSUMI ; IWASE TEPPEI</creator><creatorcontrib>OTANI KATSUMI ; IWASE TEPPEI</creatorcontrib><description>PROBLEM TO BE SOLVED: To prevent the occurrence of cracks in a sealing resin while preventing the formation of resin burrs.SOLUTION: A semiconductor device has: a semiconductor chip 1; a die pad 2A having the semiconductor chip 1 fixed on the top face thereof with an adhesive member 3; a lead frame 2 having leads 2B arranged around the die pad 2A and suspension leads 2C connected to the die pad 2A; thin metal wires 4 which electrically connect the semiconductor chip 1 with the leads 2B; and a sealing resin 5 which integrally seals the semiconductor chip 1, the die pad 2A, the leads 2B, the suspension leads 2C and the thin metal wires 4. A step portion 6 is provided on the peripheral part 2p of the die pad 2A. The undersurface of a part except the peripheral part 2p of the die pad 2A is exposed from the sealing resin 5. The sealing resin 5 enters the inside of the step portion 6. The depth of the step portion 6 increases from the step surface of the step portion 6 toward the side face of the die pad 2A.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121210&DB=EPODOC&CC=JP&NR=2012244038A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121210&DB=EPODOC&CC=JP&NR=2012244038A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OTANI KATSUMI</creatorcontrib><creatorcontrib>IWASE TEPPEI</creatorcontrib><title>LEAD FRAME, SEMICONDUCTOR DEVICE HAVING THE LEAD FRAME, AND MANUFACTURING METHOD THEREFOR</title><description>PROBLEM TO BE SOLVED: To prevent the occurrence of cracks in a sealing resin while preventing the formation of resin burrs.SOLUTION: A semiconductor device has: a semiconductor chip 1; a die pad 2A having the semiconductor chip 1 fixed on the top face thereof with an adhesive member 3; a lead frame 2 having leads 2B arranged around the die pad 2A and suspension leads 2C connected to the die pad 2A; thin metal wires 4 which electrically connect the semiconductor chip 1 with the leads 2B; and a sealing resin 5 which integrally seals the semiconductor chip 1, the die pad 2A, the leads 2B, the suspension leads 2C and the thin metal wires 4. A step portion 6 is provided on the peripheral part 2p of the die pad 2A. The undersurface of a part except the peripheral part 2p of the die pad 2A is exposed from the sealing resin 5. The sealing resin 5 enters the inside of the step portion 6. The depth of the step portion 6 increases from the step surface of the step portion 6 toward the side face of the die pad 2A.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAsDqL-w-GsUNMOrkdyMRGTyJkUnEqROIkW6v8jBQdHp7e8ubieCDUYRk8buJB3KgadVYoMmlqnCCy2LhwgWYLfi0GDx5ANqpR5Gp6SjXqKTCbyUszu_WMsq68LsTaUlN2W4dWVcehv5Vne3fEsq52UTVPVe6z_Sh8rDDFW</recordid><startdate>20121210</startdate><enddate>20121210</enddate><creator>OTANI KATSUMI</creator><creator>IWASE TEPPEI</creator><scope>EVB</scope></search><sort><creationdate>20121210</creationdate><title>LEAD FRAME, SEMICONDUCTOR DEVICE HAVING THE LEAD FRAME, AND MANUFACTURING METHOD THEREFOR</title><author>OTANI KATSUMI ; IWASE TEPPEI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2012244038A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>OTANI KATSUMI</creatorcontrib><creatorcontrib>IWASE TEPPEI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OTANI KATSUMI</au><au>IWASE TEPPEI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>LEAD FRAME, SEMICONDUCTOR DEVICE HAVING THE LEAD FRAME, AND MANUFACTURING METHOD THEREFOR</title><date>2012-12-10</date><risdate>2012</risdate><abstract>PROBLEM TO BE SOLVED: To prevent the occurrence of cracks in a sealing resin while preventing the formation of resin burrs.SOLUTION: A semiconductor device has: a semiconductor chip 1; a die pad 2A having the semiconductor chip 1 fixed on the top face thereof with an adhesive member 3; a lead frame 2 having leads 2B arranged around the die pad 2A and suspension leads 2C connected to the die pad 2A; thin metal wires 4 which electrically connect the semiconductor chip 1 with the leads 2B; and a sealing resin 5 which integrally seals the semiconductor chip 1, the die pad 2A, the leads 2B, the suspension leads 2C and the thin metal wires 4. A step portion 6 is provided on the peripheral part 2p of the die pad 2A. The undersurface of a part except the peripheral part 2p of the die pad 2A is exposed from the sealing resin 5. The sealing resin 5 enters the inside of the step portion 6. The depth of the step portion 6 increases from the step surface of the step portion 6 toward the side face of the die pad 2A.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | LEAD FRAME, SEMICONDUCTOR DEVICE HAVING THE LEAD FRAME, AND MANUFACTURING METHOD THEREFOR |
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