OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP

PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measureme...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: NAWATA ISAO, NITTA ISAMU, NAKAYAMA TADAHIRO, KASAI SHINGO, TONO ICHIRO, WADA TAKAKI, HIRAKAWA MASAAKI, OMIYA KAYOKO, YAMAUCHI TAKEMOTO, TAKASE TOMOHIRO
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator NAWATA ISAO
NITTA ISAMU
NAKAYAMA TADAHIRO
KASAI SHINGO
TONO ICHIRO
WADA TAKAKI
HIRAKAWA MASAAKI
OMIYA KAYOKO
YAMAUCHI TAKEMOTO
TAKASE TOMOHIRO
description PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2012215553A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2012215553A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2012215553A3</originalsourceid><addsrcrecordid>eNrjZEj1DwjxdHb0UQh3DHN1D_V0cVUIiQxwVfB1dQwODXL1dfULUQiODA5x9dVBEfN1DfHwd9FRcPRzUcBhRLCrX7B_kIKzh2cADwNrWmJOcSovlOZmUHJzDXH20E0tyI9PLS5ITE7NSy2J9wowMjA0MjI0NTU1djQmShEAFYw1bQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP</title><source>esp@cenet</source><creator>NAWATA ISAO ; NITTA ISAMU ; NAKAYAMA TADAHIRO ; KASAI SHINGO ; TONO ICHIRO ; WADA TAKAKI ; HIRAKAWA MASAAKI ; OMIYA KAYOKO ; YAMAUCHI TAKEMOTO ; TAKASE TOMOHIRO</creator><creatorcontrib>NAWATA ISAO ; NITTA ISAMU ; NAKAYAMA TADAHIRO ; KASAI SHINGO ; TONO ICHIRO ; WADA TAKAKI ; HIRAKAWA MASAAKI ; OMIYA KAYOKO ; YAMAUCHI TAKEMOTO ; TAKASE TOMOHIRO</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20121108&amp;DB=EPODOC&amp;CC=JP&amp;NR=2012215553A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20121108&amp;DB=EPODOC&amp;CC=JP&amp;NR=2012215553A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAWATA ISAO</creatorcontrib><creatorcontrib>NITTA ISAMU</creatorcontrib><creatorcontrib>NAKAYAMA TADAHIRO</creatorcontrib><creatorcontrib>KASAI SHINGO</creatorcontrib><creatorcontrib>TONO ICHIRO</creatorcontrib><creatorcontrib>WADA TAKAKI</creatorcontrib><creatorcontrib>HIRAKAWA MASAAKI</creatorcontrib><creatorcontrib>OMIYA KAYOKO</creatorcontrib><creatorcontrib>YAMAUCHI TAKEMOTO</creatorcontrib><creatorcontrib>TAKASE TOMOHIRO</creatorcontrib><title>OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP</title><description>PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZEj1DwjxdHb0UQh3DHN1D_V0cVUIiQxwVfB1dQwODXL1dfULUQiODA5x9dVBEfN1DfHwd9FRcPRzUcBhRLCrX7B_kIKzh2cADwNrWmJOcSovlOZmUHJzDXH20E0tyI9PLS5ITE7NSy2J9wowMjA0MjI0NTU1djQmShEAFYw1bQ</recordid><startdate>20121108</startdate><enddate>20121108</enddate><creator>NAWATA ISAO</creator><creator>NITTA ISAMU</creator><creator>NAKAYAMA TADAHIRO</creator><creator>KASAI SHINGO</creator><creator>TONO ICHIRO</creator><creator>WADA TAKAKI</creator><creator>HIRAKAWA MASAAKI</creator><creator>OMIYA KAYOKO</creator><creator>YAMAUCHI TAKEMOTO</creator><creator>TAKASE TOMOHIRO</creator><scope>EVB</scope></search><sort><creationdate>20121108</creationdate><title>OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP</title><author>NAWATA ISAO ; NITTA ISAMU ; NAKAYAMA TADAHIRO ; KASAI SHINGO ; TONO ICHIRO ; WADA TAKAKI ; HIRAKAWA MASAAKI ; OMIYA KAYOKO ; YAMAUCHI TAKEMOTO ; TAKASE TOMOHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2012215553A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAWATA ISAO</creatorcontrib><creatorcontrib>NITTA ISAMU</creatorcontrib><creatorcontrib>NAKAYAMA TADAHIRO</creatorcontrib><creatorcontrib>KASAI SHINGO</creatorcontrib><creatorcontrib>TONO ICHIRO</creatorcontrib><creatorcontrib>WADA TAKAKI</creatorcontrib><creatorcontrib>HIRAKAWA MASAAKI</creatorcontrib><creatorcontrib>OMIYA KAYOKO</creatorcontrib><creatorcontrib>YAMAUCHI TAKEMOTO</creatorcontrib><creatorcontrib>TAKASE TOMOHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAWATA ISAO</au><au>NITTA ISAMU</au><au>NAKAYAMA TADAHIRO</au><au>KASAI SHINGO</au><au>TONO ICHIRO</au><au>WADA TAKAKI</au><au>HIRAKAWA MASAAKI</au><au>OMIYA KAYOKO</au><au>YAMAUCHI TAKEMOTO</au><au>TAKASE TOMOHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP</title><date>2012-11-08</date><risdate>2012</risdate><abstract>PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2012215553A
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-18T18%3A24%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAWATA%20ISAO&rft.date=2012-11-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2012215553A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true