OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP
PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measureme...
Gespeichert in:
Hauptverfasser: | , , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | NAWATA ISAO NITTA ISAMU NAKAYAMA TADAHIRO KASAI SHINGO TONO ICHIRO WADA TAKAKI HIRAKAWA MASAAKI OMIYA KAYOKO YAMAUCHI TAKEMOTO TAKASE TOMOHIRO |
description | PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2012215553A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2012215553A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2012215553A3</originalsourceid><addsrcrecordid>eNrjZEj1DwjxdHb0UQh3DHN1D_V0cVUIiQxwVfB1dQwODXL1dfULUQiODA5x9dVBEfN1DfHwd9FRcPRzUcBhRLCrX7B_kIKzh2cADwNrWmJOcSovlOZmUHJzDXH20E0tyI9PLS5ITE7NSy2J9wowMjA0MjI0NTU1djQmShEAFYw1bQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP</title><source>esp@cenet</source><creator>NAWATA ISAO ; NITTA ISAMU ; NAKAYAMA TADAHIRO ; KASAI SHINGO ; TONO ICHIRO ; WADA TAKAKI ; HIRAKAWA MASAAKI ; OMIYA KAYOKO ; YAMAUCHI TAKEMOTO ; TAKASE TOMOHIRO</creator><creatorcontrib>NAWATA ISAO ; NITTA ISAMU ; NAKAYAMA TADAHIRO ; KASAI SHINGO ; TONO ICHIRO ; WADA TAKAKI ; HIRAKAWA MASAAKI ; OMIYA KAYOKO ; YAMAUCHI TAKEMOTO ; TAKASE TOMOHIRO</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121108&DB=EPODOC&CC=JP&NR=2012215553A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20121108&DB=EPODOC&CC=JP&NR=2012215553A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAWATA ISAO</creatorcontrib><creatorcontrib>NITTA ISAMU</creatorcontrib><creatorcontrib>NAKAYAMA TADAHIRO</creatorcontrib><creatorcontrib>KASAI SHINGO</creatorcontrib><creatorcontrib>TONO ICHIRO</creatorcontrib><creatorcontrib>WADA TAKAKI</creatorcontrib><creatorcontrib>HIRAKAWA MASAAKI</creatorcontrib><creatorcontrib>OMIYA KAYOKO</creatorcontrib><creatorcontrib>YAMAUCHI TAKEMOTO</creatorcontrib><creatorcontrib>TAKASE TOMOHIRO</creatorcontrib><title>OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP</title><description>PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZEj1DwjxdHb0UQh3DHN1D_V0cVUIiQxwVfB1dQwODXL1dfULUQiODA5x9dVBEfN1DfHwd9FRcPRzUcBhRLCrX7B_kIKzh2cADwNrWmJOcSovlOZmUHJzDXH20E0tyI9PLS5ITE7NSy2J9wowMjA0MjI0NTU1djQmShEAFYw1bQ</recordid><startdate>20121108</startdate><enddate>20121108</enddate><creator>NAWATA ISAO</creator><creator>NITTA ISAMU</creator><creator>NAKAYAMA TADAHIRO</creator><creator>KASAI SHINGO</creator><creator>TONO ICHIRO</creator><creator>WADA TAKAKI</creator><creator>HIRAKAWA MASAAKI</creator><creator>OMIYA KAYOKO</creator><creator>YAMAUCHI TAKEMOTO</creator><creator>TAKASE TOMOHIRO</creator><scope>EVB</scope></search><sort><creationdate>20121108</creationdate><title>OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP</title><author>NAWATA ISAO ; NITTA ISAMU ; NAKAYAMA TADAHIRO ; KASAI SHINGO ; TONO ICHIRO ; WADA TAKAKI ; HIRAKAWA MASAAKI ; OMIYA KAYOKO ; YAMAUCHI TAKEMOTO ; TAKASE TOMOHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2012215553A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAWATA ISAO</creatorcontrib><creatorcontrib>NITTA ISAMU</creatorcontrib><creatorcontrib>NAKAYAMA TADAHIRO</creatorcontrib><creatorcontrib>KASAI SHINGO</creatorcontrib><creatorcontrib>TONO ICHIRO</creatorcontrib><creatorcontrib>WADA TAKAKI</creatorcontrib><creatorcontrib>HIRAKAWA MASAAKI</creatorcontrib><creatorcontrib>OMIYA KAYOKO</creatorcontrib><creatorcontrib>YAMAUCHI TAKEMOTO</creatorcontrib><creatorcontrib>TAKASE TOMOHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAWATA ISAO</au><au>NITTA ISAMU</au><au>NAKAYAMA TADAHIRO</au><au>KASAI SHINGO</au><au>TONO ICHIRO</au><au>WADA TAKAKI</au><au>HIRAKAWA MASAAKI</au><au>OMIYA KAYOKO</au><au>YAMAUCHI TAKEMOTO</au><au>TAKASE TOMOHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP</title><date>2012-11-08</date><risdate>2012</risdate><abstract>PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof.SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_JP2012215553A |
source | esp@cenet |
subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-18T18%3A24%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAWATA%20ISAO&rft.date=2012-11-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2012215553A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |