CALIBRATION METHOD OF SURFACE QUALITY MEASURING MACHINE

PROBLEM TO BE SOLVED: To provide a calibration method of a surface quality measuring machine, which can accurately grasp mutual positional relations between an upward stylus and a downward stylus.SOLUTION: A calibration method of a surface quality measuring machine includes an X-axis shape measureme...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: OMORI YOSHIYUKI, MIKI AKIO
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator OMORI YOSHIYUKI
MIKI AKIO
description PROBLEM TO BE SOLVED: To provide a calibration method of a surface quality measuring machine, which can accurately grasp mutual positional relations between an upward stylus and a downward stylus.SOLUTION: A calibration method of a surface quality measuring machine includes an X-axis shape measurement data acquisition step for acquiring X-axis upper shape measurement data by relatively moving a downward stylus in an X-axis direction while keeping it contacting to an upper surface of a reference sphere and also for acquiring X-axis lower shape measurement data by relatively moving an upward stylus in the X-axis direction while keeping it contacting to a lower surface of the reference sphere, and an offset amount calculation step for calculating offset amounts ΔX, ΔZ of the upward and downward styluses from central coordinates O3, O4 obtained by the X-axis shape measurement data acquisition step.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2012211891A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2012211891A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2012211891A3</originalsourceid><addsrcrecordid>eNrjZDB3dvTxdApyDPH091PwdQ3x8HdR8HdTCA4NcnN0dlUIDAVKh0QCZRyBQp5-7gq-js4enn6uPAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3ivAyMDQyMjQ0MLS0NGYKEUAiV8omA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CALIBRATION METHOD OF SURFACE QUALITY MEASURING MACHINE</title><source>esp@cenet</source><creator>OMORI YOSHIYUKI ; MIKI AKIO</creator><creatorcontrib>OMORI YOSHIYUKI ; MIKI AKIO</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a calibration method of a surface quality measuring machine, which can accurately grasp mutual positional relations between an upward stylus and a downward stylus.SOLUTION: A calibration method of a surface quality measuring machine includes an X-axis shape measurement data acquisition step for acquiring X-axis upper shape measurement data by relatively moving a downward stylus in an X-axis direction while keeping it contacting to an upper surface of a reference sphere and also for acquiring X-axis lower shape measurement data by relatively moving an upward stylus in the X-axis direction while keeping it contacting to a lower surface of the reference sphere, and an offset amount calculation step for calculating offset amounts ΔX, ΔZ of the upward and downward styluses from central coordinates O3, O4 obtained by the X-axis shape measurement data acquisition step.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20121101&amp;DB=EPODOC&amp;CC=JP&amp;NR=2012211891A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20121101&amp;DB=EPODOC&amp;CC=JP&amp;NR=2012211891A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OMORI YOSHIYUKI</creatorcontrib><creatorcontrib>MIKI AKIO</creatorcontrib><title>CALIBRATION METHOD OF SURFACE QUALITY MEASURING MACHINE</title><description>PROBLEM TO BE SOLVED: To provide a calibration method of a surface quality measuring machine, which can accurately grasp mutual positional relations between an upward stylus and a downward stylus.SOLUTION: A calibration method of a surface quality measuring machine includes an X-axis shape measurement data acquisition step for acquiring X-axis upper shape measurement data by relatively moving a downward stylus in an X-axis direction while keeping it contacting to an upper surface of a reference sphere and also for acquiring X-axis lower shape measurement data by relatively moving an upward stylus in the X-axis direction while keeping it contacting to a lower surface of the reference sphere, and an offset amount calculation step for calculating offset amounts ΔX, ΔZ of the upward and downward styluses from central coordinates O3, O4 obtained by the X-axis shape measurement data acquisition step.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB3dvTxdApyDPH091PwdQ3x8HdR8HdTCA4NcnN0dlUIDAVKh0QCZRyBQp5-7gq-js4enn6uPAysaYk5xam8UJqbQcnNNcTZQze1ID8-tbggMTk1L7Uk3ivAyMDQyMjQ0MLS0NGYKEUAiV8omA</recordid><startdate>20121101</startdate><enddate>20121101</enddate><creator>OMORI YOSHIYUKI</creator><creator>MIKI AKIO</creator><scope>EVB</scope></search><sort><creationdate>20121101</creationdate><title>CALIBRATION METHOD OF SURFACE QUALITY MEASURING MACHINE</title><author>OMORI YOSHIYUKI ; MIKI AKIO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2012211891A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OMORI YOSHIYUKI</creatorcontrib><creatorcontrib>MIKI AKIO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OMORI YOSHIYUKI</au><au>MIKI AKIO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CALIBRATION METHOD OF SURFACE QUALITY MEASURING MACHINE</title><date>2012-11-01</date><risdate>2012</risdate><abstract>PROBLEM TO BE SOLVED: To provide a calibration method of a surface quality measuring machine, which can accurately grasp mutual positional relations between an upward stylus and a downward stylus.SOLUTION: A calibration method of a surface quality measuring machine includes an X-axis shape measurement data acquisition step for acquiring X-axis upper shape measurement data by relatively moving a downward stylus in an X-axis direction while keeping it contacting to an upper surface of a reference sphere and also for acquiring X-axis lower shape measurement data by relatively moving an upward stylus in the X-axis direction while keeping it contacting to a lower surface of the reference sphere, and an offset amount calculation step for calculating offset amounts ΔX, ΔZ of the upward and downward styluses from central coordinates O3, O4 obtained by the X-axis shape measurement data acquisition step.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2012211891A
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title CALIBRATION METHOD OF SURFACE QUALITY MEASURING MACHINE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T03%3A20%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=OMORI%20YOSHIYUKI&rft.date=2012-11-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2012211891A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true