SCANNING ELECTRON MICROSCOPE

PROBLEM TO BE SOLVED: To provide a scanning electron microscope in which the contrast and brightness of a scan image can be adjusted more appropriately.SOLUTION: The scanning electron microscope comprises a scanning unit which scans a specimen with an electron beam, a detector 12 which detects elect...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	YOSHIIE MITSUYOSHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY
Online-Zugang:	Volltext bestellen
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