SLIT LIGHT LUMINANCE DISTRIBUTION DESIGN METHOD AND OPTICAL CUTTING IRREGULARITY FLAW DETECTION DEVICE

PROBLEM TO BE SOLVED: To provide a slit light luminance distribution design method and an optical cutting irregularity flaw detection device for performing stable optical cutting irregularity flaw detection corresponding to the range widening and speeding-up of surface flaw inspection.SOLUTION: The...

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Bibliographische Detailangaben

Hauptverfasser:	YAMAHIRA NAOFUMI, KODAMA TOSHIBUMI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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