METHOD AND DEVICE FOR MEASURING LIQUID FILM OF ANALYTE
PROBLEM TO BE SOLVED: To solve the problem that a measurement region is obtained as two-dimensional or three-dimensional continuous information by a CT image in order to calculate distribution information of liquid film thickness at a two-phase flow state in a vessel, and it becomes necessary to gra...
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| creator | OKADA KOICHI NUKAGA ATSUSHI SADAOKA NORIYUKI |
| description | PROBLEM TO BE SOLVED: To solve the problem that a measurement region is obtained as two-dimensional or three-dimensional continuous information by a CT image in order to calculate distribution information of liquid film thickness at a two-phase flow state in a vessel, and it becomes necessary to grasp correlation with a true value of the liquid film in order to measure liquid film distribution when it is attempted to evaluate the liquid film thickness in a time average image by a CT device.SOLUTION: This device for measuring liquid film of an analyte has an X-ray CT device comprising an X-ray source with energy which penetrates the analyte, a detector which detects penetrated X-rays, and a mechanism capable of acquiring penetrated data from all the circumferential directions of the analyte; and at least one thickness measurement instrument capable of measuring the liquid film thickness on the surface of the vessel in the analyte, executes calibration of the liquid film thickness at a part corresponding to a measurement position of the thickness measurement instrument in a CT image to be acquired by the X-ray CT device by a measurement value of the thickness measurement instrument to calculate the liquid film thickness from the CT image. |
| format | Patent |
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and at least one thickness measurement instrument capable of measuring the liquid film thickness on the surface of the vessel in the analyte, executes calibration of the liquid film thickness at a part corresponding to a measurement position of the thickness measurement instrument in a CT image to be acquired by the X-ray CT device by a measurement value of the thickness measurement instrument to calculate the liquid film thickness from the CT image.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120329&DB=EPODOC&CC=JP&NR=2012063282A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120329&DB=EPODOC&CC=JP&NR=2012063282A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OKADA KOICHI</creatorcontrib><creatorcontrib>NUKAGA ATSUSHI</creatorcontrib><creatorcontrib>SADAOKA NORIYUKI</creatorcontrib><title>METHOD AND DEVICE FOR MEASURING LIQUID FILM OF ANALYTE</title><description>PROBLEM TO BE SOLVED: To solve the problem that a measurement region is obtained as two-dimensional or three-dimensional continuous information by a CT image in order to calculate distribution information of liquid film thickness at a two-phase flow state in a vessel, and it becomes necessary to grasp correlation with a true value of the liquid film in order to measure liquid film distribution when it is attempted to evaluate the liquid film thickness in a time average image by a CT device.SOLUTION: This device for measuring liquid film of an analyte has an X-ray CT device comprising an X-ray source with energy which penetrates the analyte, a detector which detects penetrated X-rays, and a mechanism capable of acquiring penetrated data from all the circumferential directions of the analyte; 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and at least one thickness measurement instrument capable of measuring the liquid film thickness on the surface of the vessel in the analyte, executes calibration of the liquid film thickness at a part corresponding to a measurement position of the thickness measurement instrument in a CT image to be acquired by the X-ray CT device by a measurement value of the thickness measurement instrument to calculate the liquid film thickness from the CT image.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | METHOD AND DEVICE FOR MEASURING LIQUID FILM OF ANALYTE |
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