SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To improve performance of a semiconductor device, assure reliability of the semiconductor device, reduce chip size of the semiconductor device, especially prevent occurrence of a parasitic capacitance by controlling potential of a well at the lower part of a gate electrode with...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NITTA KYOYA, HOSHINO YUTAKA
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES
Online-Zugang:	Volltext bestellen
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