COMPOUND SEMICONDUCTOR DEVICE
PROBLEM TO BE SOLVED: To provide a compound semiconductor device which has a high threshold voltage and superior normally-off characteristics.SOLUTION: The compound semiconductor device includes a compound semiconductor layer 2, in which a two-dimensional carrier gas layer 211 is formed, the compoun...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | KANEKO NOBUO ICHIMARU KEIICHI NIISATO MASAHIRO IWAGAMI SHINICHI |
description | PROBLEM TO BE SOLVED: To provide a compound semiconductor device which has a high threshold voltage and superior normally-off characteristics.SOLUTION: The compound semiconductor device includes a compound semiconductor layer 2, in which a two-dimensional carrier gas layer 211 is formed, the compound semiconductor layer, including a carrier travel layer 21 and a carrier supply layer 22; first and second main electrodes 3 and 4, which are arranged separated from each other on the compound semiconductor layer 2 and are ohmically connected to the two-dimensional carrier gas layer 211; a metal oxide semiconductor film 8, arranged on the compound semiconductor layer 2 between the first main electrode 3 and the second main electrode 4; and a control electrode 5 arranged on the metal oxide semiconductor film 8, the control electrode, including a titanium film that contacts the metal oxide semiconductor film or a titanium-containing compound film that contacts the metal oxide semiconductor film 8. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2011204717A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2011204717A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2011204717A3</originalsourceid><addsrcrecordid>eNrjZJB19vcN8A_1c1EIdvX1dPb3cwl1DvEPUnBxDfN0duVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhoZGBibmhuaOxkQpAgDjsyGe</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>COMPOUND SEMICONDUCTOR DEVICE</title><source>esp@cenet</source><creator>KANEKO NOBUO ; ICHIMARU KEIICHI ; NIISATO MASAHIRO ; IWAGAMI SHINICHI</creator><creatorcontrib>KANEKO NOBUO ; ICHIMARU KEIICHI ; NIISATO MASAHIRO ; IWAGAMI SHINICHI</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a compound semiconductor device which has a high threshold voltage and superior normally-off characteristics.SOLUTION: The compound semiconductor device includes a compound semiconductor layer 2, in which a two-dimensional carrier gas layer 211 is formed, the compound semiconductor layer, including a carrier travel layer 21 and a carrier supply layer 22; first and second main electrodes 3 and 4, which are arranged separated from each other on the compound semiconductor layer 2 and are ohmically connected to the two-dimensional carrier gas layer 211; a metal oxide semiconductor film 8, arranged on the compound semiconductor layer 2 between the first main electrode 3 and the second main electrode 4; and a control electrode 5 arranged on the metal oxide semiconductor film 8, the control electrode, including a titanium film that contacts the metal oxide semiconductor film or a titanium-containing compound film that contacts the metal oxide semiconductor film 8.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111013&DB=EPODOC&CC=JP&NR=2011204717A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111013&DB=EPODOC&CC=JP&NR=2011204717A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KANEKO NOBUO</creatorcontrib><creatorcontrib>ICHIMARU KEIICHI</creatorcontrib><creatorcontrib>NIISATO MASAHIRO</creatorcontrib><creatorcontrib>IWAGAMI SHINICHI</creatorcontrib><title>COMPOUND SEMICONDUCTOR DEVICE</title><description>PROBLEM TO BE SOLVED: To provide a compound semiconductor device which has a high threshold voltage and superior normally-off characteristics.SOLUTION: The compound semiconductor device includes a compound semiconductor layer 2, in which a two-dimensional carrier gas layer 211 is formed, the compound semiconductor layer, including a carrier travel layer 21 and a carrier supply layer 22; first and second main electrodes 3 and 4, which are arranged separated from each other on the compound semiconductor layer 2 and are ohmically connected to the two-dimensional carrier gas layer 211; a metal oxide semiconductor film 8, arranged on the compound semiconductor layer 2 between the first main electrode 3 and the second main electrode 4; and a control electrode 5 arranged on the metal oxide semiconductor film 8, the control electrode, including a titanium film that contacts the metal oxide semiconductor film or a titanium-containing compound film that contacts the metal oxide semiconductor film 8.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB19vcN8A_1c1EIdvX1dPb3cwl1DvEPUnBxDfN0duVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhoZGBibmhuaOxkQpAgDjsyGe</recordid><startdate>20111013</startdate><enddate>20111013</enddate><creator>KANEKO NOBUO</creator><creator>ICHIMARU KEIICHI</creator><creator>NIISATO MASAHIRO</creator><creator>IWAGAMI SHINICHI</creator><scope>EVB</scope></search><sort><creationdate>20111013</creationdate><title>COMPOUND SEMICONDUCTOR DEVICE</title><author>KANEKO NOBUO ; ICHIMARU KEIICHI ; NIISATO MASAHIRO ; IWAGAMI SHINICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011204717A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>KANEKO NOBUO</creatorcontrib><creatorcontrib>ICHIMARU KEIICHI</creatorcontrib><creatorcontrib>NIISATO MASAHIRO</creatorcontrib><creatorcontrib>IWAGAMI SHINICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KANEKO NOBUO</au><au>ICHIMARU KEIICHI</au><au>NIISATO MASAHIRO</au><au>IWAGAMI SHINICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>COMPOUND SEMICONDUCTOR DEVICE</title><date>2011-10-13</date><risdate>2011</risdate><abstract>PROBLEM TO BE SOLVED: To provide a compound semiconductor device which has a high threshold voltage and superior normally-off characteristics.SOLUTION: The compound semiconductor device includes a compound semiconductor layer 2, in which a two-dimensional carrier gas layer 211 is formed, the compound semiconductor layer, including a carrier travel layer 21 and a carrier supply layer 22; first and second main electrodes 3 and 4, which are arranged separated from each other on the compound semiconductor layer 2 and are ohmically connected to the two-dimensional carrier gas layer 211; a metal oxide semiconductor film 8, arranged on the compound semiconductor layer 2 between the first main electrode 3 and the second main electrode 4; and a control electrode 5 arranged on the metal oxide semiconductor film 8, the control electrode, including a titanium film that contacts the metal oxide semiconductor film or a titanium-containing compound film that contacts the metal oxide semiconductor film 8.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_JP2011204717A |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | COMPOUND SEMICONDUCTOR DEVICE |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T18%3A26%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KANEKO%20NOBUO&rft.date=2011-10-13&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2011204717A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |