METAL DEFECT DETECTION METHOD
PROBLEM TO BE SOLVED: To provide a metal defect detection method capable of highlighting defect through etching treatment of the inspection surface of a metal sample, while when detection of the defect is carried out by imaging the inspection surface with an imaging device, brightness of non-defect...
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| creator | FUKUNAGA SHINICHI SEZE AKIFUMI TANI MASAHIRO |
| description | PROBLEM TO BE SOLVED: To provide a metal defect detection method capable of highlighting defect through etching treatment of the inspection surface of a metal sample, while when detection of the defect is carried out by imaging the inspection surface with an imaging device, brightness of non-defect parts on the imagery of inspection surface is made to be homogenized and brightened, leading clear defection of defect part.SOLUTION: An inspection surface 2 of a metal sample 1 is polished unidirectionally, by etching treatment of the metal sample 1, defect in metal material is highlighted, linearly continuous light sources or a light source (a linear light source 4) a plurality of point light source arranged linearly are used as irradiating light source, a linearly direction 17 of the linear light source 4 and the polished direction 11 are presumed to be a same direction, the inspection surface 2 is irradiated by the linear light source 4 from a perpendicular direction to the polished direction 11, and the inspection surface 2 is imaged by an imaging device 3. Thereby, brightness of the non-defect parts in the inspection imaged imageries is to be homogenized and brightened, making the defect part 6 to be detectable clearly. |
| format | Patent |
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Thereby, brightness of the non-defect parts in the inspection imaged imageries is to be homogenized and brightened, making the defect part 6 to be detectable clearly.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111013&DB=EPODOC&CC=JP&NR=2011203201A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111013&DB=EPODOC&CC=JP&NR=2011203201A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FUKUNAGA SHINICHI</creatorcontrib><creatorcontrib>SEZE AKIFUMI</creatorcontrib><creatorcontrib>TANI MASAHIRO</creatorcontrib><title>METAL DEFECT DETECTION METHOD</title><description>PROBLEM TO BE SOLVED: To provide a metal defect detection method capable of highlighting defect through etching treatment of the inspection surface of a metal sample, while when detection of the defect is carried out by imaging the inspection surface with an imaging device, brightness of non-defect parts on the imagery of inspection surface is made to be homogenized and brightened, leading clear defection of defect part.SOLUTION: An inspection surface 2 of a metal sample 1 is polished unidirectionally, by etching treatment of the metal sample 1, defect in metal material is highlighted, linearly continuous light sources or a light source (a linear light source 4) a plurality of point light source arranged linearly are used as irradiating light source, a linearly direction 17 of the linear light source 4 and the polished direction 11 are presumed to be a same direction, the inspection surface 2 is irradiated by the linear light source 4 from a perpendicular direction to the polished direction 11, and the inspection surface 2 is imaged by an imaging device 3. 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Thereby, brightness of the non-defect parts in the inspection imaged imageries is to be homogenized and brightened, making the defect part 6 to be detectable clearly.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | METAL DEFECT DETECTION METHOD |
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