DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR
PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | KANZAKI TAISUKE MATSUDA MAKOTO YAO TAKEYUKI FUKUDA MEGUMI |
description | PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2011178632A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2011178632A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2011178632A3</originalsourceid><addsrcrecordid>eNrjZDBy8XT1cXUOCfJ0VnB2DXL0BdKOfi4KPkCWn2OIqwtc1NkxwNHZM8Q_iIeBNS0xpziVF0pzMyi5uYY4e-imFuTHpxYXJCan5qWWxHsFGBkYGhqaW5gZGzkaE6UIAJk0JuM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR</title><source>esp@cenet</source><creator>KANZAKI TAISUKE ; MATSUDA MAKOTO ; YAO TAKEYUKI ; FUKUDA MEGUMI</creator><creatorcontrib>KANZAKI TAISUKE ; MATSUDA MAKOTO ; YAO TAKEYUKI ; FUKUDA MEGUMI</creatorcontrib><description><![CDATA[PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of <1 μm and nonetheless has satisfactory life properties even if high electric field intensity is imparted to the capacitor. SOLUTION: As the dielectric ceramic composing the dielectric ceramic layer 2 of a laminated ceramic capacitor 1, the dielectric ceramic is used which contains a compound expressed by (Ba1-x/100Cax/100)mTiO3(0≤x≤20) as the main component, and contains aMg-bSi-cMn-dR (R denotes at least one kind selected from among La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y; a, b, c and d [mol parts] respectively to 100 mol parts of the main component satisfy 0.1<a≤20.0, 0.5<b≤20.0, 0.1<c≤10.0 and 1.0<d≤30.0) as accessory components. The mean grain size of crystal grains in a sintered compact obtained by firing the dielectric ceramic is 20 to <100 nm. COPYRIGHT: (C)2011,JPO&INPIT]]></description><language>eng</language><subject>ARTIFICIAL STONE ; BASIC ELECTRIC ELEMENTS ; CABLES ; CAPACITORS ; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE ; CEMENTS ; CERAMICS ; CHEMISTRY ; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDINGMATERIALS ; CONCRETE ; CONDUCTORS ; ELECTRICITY ; INSULATORS ; LIME, MAGNESIA ; METALLURGY ; REFRACTORIES ; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES ; SLAG ; TREATMENT OF NATURAL STONE</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110915&DB=EPODOC&CC=JP&NR=2011178632A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110915&DB=EPODOC&CC=JP&NR=2011178632A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KANZAKI TAISUKE</creatorcontrib><creatorcontrib>MATSUDA MAKOTO</creatorcontrib><creatorcontrib>YAO TAKEYUKI</creatorcontrib><creatorcontrib>FUKUDA MEGUMI</creatorcontrib><title>DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR</title><description><![CDATA[PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of <1 μm and nonetheless has satisfactory life properties even if high electric field intensity is imparted to the capacitor. SOLUTION: As the dielectric ceramic composing the dielectric ceramic layer 2 of a laminated ceramic capacitor 1, the dielectric ceramic is used which contains a compound expressed by (Ba1-x/100Cax/100)mTiO3(0≤x≤20) as the main component, and contains aMg-bSi-cMn-dR (R denotes at least one kind selected from among La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y; a, b, c and d [mol parts] respectively to 100 mol parts of the main component satisfy 0.1<a≤20.0, 0.5<b≤20.0, 0.1<c≤10.0 and 1.0<d≤30.0) as accessory components. The mean grain size of crystal grains in a sintered compact obtained by firing the dielectric ceramic is 20 to <100 nm. COPYRIGHT: (C)2011,JPO&INPIT]]></description><subject>ARTIFICIAL STONE</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CABLES</subject><subject>CAPACITORS</subject><subject>CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE</subject><subject>CEMENTS</subject><subject>CERAMICS</subject><subject>CHEMISTRY</subject><subject>COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDINGMATERIALS</subject><subject>CONCRETE</subject><subject>CONDUCTORS</subject><subject>ELECTRICITY</subject><subject>INSULATORS</subject><subject>LIME, MAGNESIA</subject><subject>METALLURGY</subject><subject>REFRACTORIES</subject><subject>SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES</subject><subject>SLAG</subject><subject>TREATMENT OF NATURAL STONE</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBy8XT1cXUOCfJ0VnB2DXL0BdKOfi4KPkCWn2OIqwtc1NkxwNHZM8Q_iIeBNS0xpziVF0pzMyi5uYY4e-imFuTHpxYXJCan5qWWxHsFGBkYGhqaW5gZGzkaE6UIAJk0JuM</recordid><startdate>20110915</startdate><enddate>20110915</enddate><creator>KANZAKI TAISUKE</creator><creator>MATSUDA MAKOTO</creator><creator>YAO TAKEYUKI</creator><creator>FUKUDA MEGUMI</creator><scope>EVB</scope></search><sort><creationdate>20110915</creationdate><title>DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR</title><author>KANZAKI TAISUKE ; MATSUDA MAKOTO ; YAO TAKEYUKI ; FUKUDA MEGUMI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011178632A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>ARTIFICIAL STONE</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CABLES</topic><topic>CAPACITORS</topic><topic>CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE</topic><topic>CEMENTS</topic><topic>CERAMICS</topic><topic>CHEMISTRY</topic><topic>COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDINGMATERIALS</topic><topic>CONCRETE</topic><topic>CONDUCTORS</topic><topic>ELECTRICITY</topic><topic>INSULATORS</topic><topic>LIME, MAGNESIA</topic><topic>METALLURGY</topic><topic>REFRACTORIES</topic><topic>SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES</topic><topic>SLAG</topic><topic>TREATMENT OF NATURAL STONE</topic><toplevel>online_resources</toplevel><creatorcontrib>KANZAKI TAISUKE</creatorcontrib><creatorcontrib>MATSUDA MAKOTO</creatorcontrib><creatorcontrib>YAO TAKEYUKI</creatorcontrib><creatorcontrib>FUKUDA MEGUMI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KANZAKI TAISUKE</au><au>MATSUDA MAKOTO</au><au>YAO TAKEYUKI</au><au>FUKUDA MEGUMI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR</title><date>2011-09-15</date><risdate>2011</risdate><abstract><![CDATA[PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of <1 μm and nonetheless has satisfactory life properties even if high electric field intensity is imparted to the capacitor. SOLUTION: As the dielectric ceramic composing the dielectric ceramic layer 2 of a laminated ceramic capacitor 1, the dielectric ceramic is used which contains a compound expressed by (Ba1-x/100Cax/100)mTiO3(0≤x≤20) as the main component, and contains aMg-bSi-cMn-dR (R denotes at least one kind selected from among La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y; a, b, c and d [mol parts] respectively to 100 mol parts of the main component satisfy 0.1<a≤20.0, 0.5<b≤20.0, 0.1<c≤10.0 and 1.0<d≤30.0) as accessory components. The mean grain size of crystal grains in a sintered compact obtained by firing the dielectric ceramic is 20 to <100 nm. COPYRIGHT: (C)2011,JPO&INPIT]]></abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_JP2011178632A |
source | esp@cenet |
subjects | ARTIFICIAL STONE BASIC ELECTRIC ELEMENTS CABLES CAPACITORS CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE CEMENTS CERAMICS CHEMISTRY COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDINGMATERIALS CONCRETE CONDUCTORS ELECTRICITY INSULATORS LIME, MAGNESIA METALLURGY REFRACTORIES SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES SLAG TREATMENT OF NATURAL STONE |
title | DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T10%3A24%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KANZAKI%20TAISUKE&rft.date=2011-09-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2011178632A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |