DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR

PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KANZAKI TAISUKE, MATSUDA MAKOTO, YAO TAKEYUKI, FUKUDA MEGUMI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator KANZAKI TAISUKE
MATSUDA MAKOTO
YAO TAKEYUKI
FUKUDA MEGUMI
description PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2011178632A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2011178632A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2011178632A3</originalsourceid><addsrcrecordid>eNrjZDBy8XT1cXUOCfJ0VnB2DXL0BdKOfi4KPkCWn2OIqwtc1NkxwNHZM8Q_iIeBNS0xpziVF0pzMyi5uYY4e-imFuTHpxYXJCan5qWWxHsFGBkYGhqaW5gZGzkaE6UIAJk0JuM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR</title><source>esp@cenet</source><creator>KANZAKI TAISUKE ; MATSUDA MAKOTO ; YAO TAKEYUKI ; FUKUDA MEGUMI</creator><creatorcontrib>KANZAKI TAISUKE ; MATSUDA MAKOTO ; YAO TAKEYUKI ; FUKUDA MEGUMI</creatorcontrib><description><![CDATA[PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of <1 μm and nonetheless has satisfactory life properties even if high electric field intensity is imparted to the capacitor. SOLUTION: As the dielectric ceramic composing the dielectric ceramic layer 2 of a laminated ceramic capacitor 1, the dielectric ceramic is used which contains a compound expressed by (Ba1-x/100Cax/100)mTiO3(0≤x≤20) as the main component, and contains aMg-bSi-cMn-dR (R denotes at least one kind selected from among La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y; a, b, c and d [mol parts] respectively to 100 mol parts of the main component satisfy 0.1<a≤20.0, 0.5<b≤20.0, 0.1<c≤10.0 and 1.0<d≤30.0) as accessory components. The mean grain size of crystal grains in a sintered compact obtained by firing the dielectric ceramic is 20 to <100 nm. COPYRIGHT: (C)2011,JPO&INPIT]]></description><language>eng</language><subject>ARTIFICIAL STONE ; BASIC ELECTRIC ELEMENTS ; CABLES ; CAPACITORS ; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE ; CEMENTS ; CERAMICS ; CHEMISTRY ; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDINGMATERIALS ; CONCRETE ; CONDUCTORS ; ELECTRICITY ; INSULATORS ; LIME, MAGNESIA ; METALLURGY ; REFRACTORIES ; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES ; SLAG ; TREATMENT OF NATURAL STONE</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110915&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011178632A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110915&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011178632A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KANZAKI TAISUKE</creatorcontrib><creatorcontrib>MATSUDA MAKOTO</creatorcontrib><creatorcontrib>YAO TAKEYUKI</creatorcontrib><creatorcontrib>FUKUDA MEGUMI</creatorcontrib><title>DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR</title><description><![CDATA[PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of <1 μm and nonetheless has satisfactory life properties even if high electric field intensity is imparted to the capacitor. SOLUTION: As the dielectric ceramic composing the dielectric ceramic layer 2 of a laminated ceramic capacitor 1, the dielectric ceramic is used which contains a compound expressed by (Ba1-x/100Cax/100)mTiO3(0≤x≤20) as the main component, and contains aMg-bSi-cMn-dR (R denotes at least one kind selected from among La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y; a, b, c and d [mol parts] respectively to 100 mol parts of the main component satisfy 0.1<a≤20.0, 0.5<b≤20.0, 0.1<c≤10.0 and 1.0<d≤30.0) as accessory components. The mean grain size of crystal grains in a sintered compact obtained by firing the dielectric ceramic is 20 to <100 nm. COPYRIGHT: (C)2011,JPO&INPIT]]></description><subject>ARTIFICIAL STONE</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CABLES</subject><subject>CAPACITORS</subject><subject>CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE</subject><subject>CEMENTS</subject><subject>CERAMICS</subject><subject>CHEMISTRY</subject><subject>COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDINGMATERIALS</subject><subject>CONCRETE</subject><subject>CONDUCTORS</subject><subject>ELECTRICITY</subject><subject>INSULATORS</subject><subject>LIME, MAGNESIA</subject><subject>METALLURGY</subject><subject>REFRACTORIES</subject><subject>SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES</subject><subject>SLAG</subject><subject>TREATMENT OF NATURAL STONE</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBy8XT1cXUOCfJ0VnB2DXL0BdKOfi4KPkCWn2OIqwtc1NkxwNHZM8Q_iIeBNS0xpziVF0pzMyi5uYY4e-imFuTHpxYXJCan5qWWxHsFGBkYGhqaW5gZGzkaE6UIAJk0JuM</recordid><startdate>20110915</startdate><enddate>20110915</enddate><creator>KANZAKI TAISUKE</creator><creator>MATSUDA MAKOTO</creator><creator>YAO TAKEYUKI</creator><creator>FUKUDA MEGUMI</creator><scope>EVB</scope></search><sort><creationdate>20110915</creationdate><title>DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR</title><author>KANZAKI TAISUKE ; MATSUDA MAKOTO ; YAO TAKEYUKI ; FUKUDA MEGUMI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011178632A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>ARTIFICIAL STONE</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CABLES</topic><topic>CAPACITORS</topic><topic>CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE</topic><topic>CEMENTS</topic><topic>CERAMICS</topic><topic>CHEMISTRY</topic><topic>COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDINGMATERIALS</topic><topic>CONCRETE</topic><topic>CONDUCTORS</topic><topic>ELECTRICITY</topic><topic>INSULATORS</topic><topic>LIME, MAGNESIA</topic><topic>METALLURGY</topic><topic>REFRACTORIES</topic><topic>SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES</topic><topic>SLAG</topic><topic>TREATMENT OF NATURAL STONE</topic><toplevel>online_resources</toplevel><creatorcontrib>KANZAKI TAISUKE</creatorcontrib><creatorcontrib>MATSUDA MAKOTO</creatorcontrib><creatorcontrib>YAO TAKEYUKI</creatorcontrib><creatorcontrib>FUKUDA MEGUMI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KANZAKI TAISUKE</au><au>MATSUDA MAKOTO</au><au>YAO TAKEYUKI</au><au>FUKUDA MEGUMI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR</title><date>2011-09-15</date><risdate>2011</risdate><abstract><![CDATA[PROBLEM TO BE SOLVED: To provide a laminated ceramic capacitor which has a dielectric ceramic layer thinned to a thickness of <1 μm and nonetheless has satisfactory life properties even if high electric field intensity is imparted to the capacitor. SOLUTION: As the dielectric ceramic composing the dielectric ceramic layer 2 of a laminated ceramic capacitor 1, the dielectric ceramic is used which contains a compound expressed by (Ba1-x/100Cax/100)mTiO3(0≤x≤20) as the main component, and contains aMg-bSi-cMn-dR (R denotes at least one kind selected from among La, Ce, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu and Y; a, b, c and d [mol parts] respectively to 100 mol parts of the main component satisfy 0.1<a≤20.0, 0.5<b≤20.0, 0.1<c≤10.0 and 1.0<d≤30.0) as accessory components. The mean grain size of crystal grains in a sintered compact obtained by firing the dielectric ceramic is 20 to <100 nm. COPYRIGHT: (C)2011,JPO&INPIT]]></abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2011178632A
source esp@cenet
subjects ARTIFICIAL STONE
BASIC ELECTRIC ELEMENTS
CABLES
CAPACITORS
CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
CEMENTS
CERAMICS
CHEMISTRY
COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDINGMATERIALS
CONCRETE
CONDUCTORS
ELECTRICITY
INSULATORS
LIME, MAGNESIA
METALLURGY
REFRACTORIES
SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES
SLAG
TREATMENT OF NATURAL STONE
title DIELECTRIC CERAMIC AND LAMINATED CERAMIC CAPACITOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T10%3A24%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KANZAKI%20TAISUKE&rft.date=2011-09-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2011178632A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true