INFRARED DETECTOR
PROBLEM TO BE SOLVED: To provide an infrared detector having high sensitivity, capable of suppressing peeling-off of an optical filter film for an infrared ray at a manufacturing time, while securing airtightness. SOLUTION: This infrared detector includes: a package body 4 on which an infrared detec...
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| creator | SANAGAWA YOSHIHARU UEDA MICHIHIKO |
| description | PROBLEM TO BE SOLVED: To provide an infrared detector having high sensitivity, capable of suppressing peeling-off of an optical filter film for an infrared ray at a manufacturing time, while securing airtightness. SOLUTION: This infrared detector includes: a package body 4 on which an infrared detection element 1 is mounted; a package lid 5 joined airtightly to the package body 4; a cap material 6 formed of a first inorganic material through which an infrared ray is transmitted, and arranged so as to block an opening part 5a of the package lid 5; and a lens 7 formed of a second inorganic material through which the infrared ray is transmitted, and arranged outside the package lid 5 on a separated position from the infrared detection element 1 more than the cap material 6. An optical filter film for the infrared ray is laminated on the lens 7, and the cap material 6 is joined airtightly to the package lid 5, and the lens 7 is joined to the package lid 5 by a conductive paste, to be thereby connected electrically to the package lid 5. COPYRIGHT: (C)2011,JPO&INPIT |
| format | Patent |
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SOLUTION: This infrared detector includes: a package body 4 on which an infrared detection element 1 is mounted; a package lid 5 joined airtightly to the package body 4; a cap material 6 formed of a first inorganic material through which an infrared ray is transmitted, and arranged so as to block an opening part 5a of the package lid 5; and a lens 7 formed of a second inorganic material through which the infrared ray is transmitted, and arranged outside the package lid 5 on a separated position from the infrared detection element 1 more than the cap material 6. An optical filter film for the infrared ray is laminated on the lens 7, and the cap material 6 is joined airtightly to the package lid 5, and the lens 7 is joined to the package lid 5 by a conductive paste, to be thereby connected electrically to the package lid 5. 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COPYRIGHT: (C)2011,JPO&INPIT</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>COLORIMETRY</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>RADIATION PYROMETRY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBD09HMLcgxydVFwcQ1xdQ7xD-JhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhoaG5ibmZsaOxkQpAgBXSR4x</recordid><startdate>20110908</startdate><enddate>20110908</enddate><creator>SANAGAWA YOSHIHARU</creator><creator>UEDA MICHIHIKO</creator><scope>EVB</scope></search><sort><creationdate>20110908</creationdate><title>INFRARED DETECTOR</title><author>SANAGAWA YOSHIHARU ; UEDA MICHIHIKO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011174763A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>COLORIMETRY</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>RADIATION PYROMETRY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SANAGAWA YOSHIHARU</creatorcontrib><creatorcontrib>UEDA MICHIHIKO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SANAGAWA YOSHIHARU</au><au>UEDA MICHIHIKO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INFRARED DETECTOR</title><date>2011-09-08</date><risdate>2011</risdate><abstract>PROBLEM TO BE SOLVED: To provide an infrared detector having high sensitivity, capable of suppressing peeling-off of an optical filter film for an infrared ray at a manufacturing time, while securing airtightness. 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| subjects | BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING |
| title | INFRARED DETECTOR |
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