MEASURING APPARATUS AND MEASURING METHOD

PROBLEM TO BE SOLVED: To detect an electric characteristic value of a signal to be measured and detect its state while avoiding a rise in the cost of the apparatus. SOLUTION: A measuring apparatus has a filter 3 for receiving an input of a signal to be measured S1 and passing only a frequency compon...

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description PROBLEM TO BE SOLVED: To detect an electric characteristic value of a signal to be measured and detect its state while avoiding a rise in the cost of the apparatus. SOLUTION: A measuring apparatus has a filter 3 for receiving an input of a signal to be measured S1 and passing only a frequency component within a measurement band. A measuring section 4 outputs an effective value of the signal to be measured S1 as a first effective value Vr1 and outputs the effective value of the signal to be measured S1 outputted from the filter section 3 as a second effective value Vr2. A processing section 5 executes the determination processing of determining whether both effective values Vr1 and Vr2 are matched with each other within an error range (specified range) De and whether the first effective value Vr1 exceeds the specified range and is larger than the second effective value Vr2 or not; the determination processing of determining whether the degree of a variation of the first effective value Vr1 exceeds a first reference value Dref1 or not; and the determination processing of determining whether the degree of a variation of the second effective value Vr2 exceeds a second reference value Dref2 or not, determines the state of the signal to be measured S1 on the basis of a result of the determination at each determination processing, and makes a display section 7 display the state of the signal to be measured S1. COPYRIGHT: (C)2011,JPO&INPIT
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2011163838A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2011163838A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2011163838A3</originalsourceid><addsrcrecordid>eNrjZNDwdXUMDg3y9HNXcAwIcAxyDAkNVnD0c1FAiPu6hnj4u_AwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDQ0NDM2MLYwtHY6IUAQBaXiSg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MEASURING APPARATUS AND MEASURING METHOD</title><source>esp@cenet</source><creator>KOIKE SHINICHI</creator><creatorcontrib>KOIKE SHINICHI</creatorcontrib><description>PROBLEM TO BE SOLVED: To detect an electric characteristic value of a signal to be measured and detect its state while avoiding a rise in the cost of the apparatus. SOLUTION: A measuring apparatus has a filter 3 for receiving an input of a signal to be measured S1 and passing only a frequency component within a measurement band. A measuring section 4 outputs an effective value of the signal to be measured S1 as a first effective value Vr1 and outputs the effective value of the signal to be measured S1 outputted from the filter section 3 as a second effective value Vr2. A processing section 5 executes the determination processing of determining whether both effective values Vr1 and Vr2 are matched with each other within an error range (specified range) De and whether the first effective value Vr1 exceeds the specified range and is larger than the second effective value Vr2 or not; the determination processing of determining whether the degree of a variation of the first effective value Vr1 exceeds a first reference value Dref1 or not; and the determination processing of determining whether the degree of a variation of the second effective value Vr2 exceeds a second reference value Dref2 or not, determines the state of the signal to be measured S1 on the basis of a result of the determination at each determination processing, and makes a display section 7 display the state of the signal to be measured S1. COPYRIGHT: (C)2011,JPO&amp;INPIT</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110825&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011163838A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110825&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011163838A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KOIKE SHINICHI</creatorcontrib><title>MEASURING APPARATUS AND MEASURING METHOD</title><description>PROBLEM TO BE SOLVED: To detect an electric characteristic value of a signal to be measured and detect its state while avoiding a rise in the cost of the apparatus. SOLUTION: A measuring apparatus has a filter 3 for receiving an input of a signal to be measured S1 and passing only a frequency component within a measurement band. A measuring section 4 outputs an effective value of the signal to be measured S1 as a first effective value Vr1 and outputs the effective value of the signal to be measured S1 outputted from the filter section 3 as a second effective value Vr2. A processing section 5 executes the determination processing of determining whether both effective values Vr1 and Vr2 are matched with each other within an error range (specified range) De and whether the first effective value Vr1 exceeds the specified range and is larger than the second effective value Vr2 or not; the determination processing of determining whether the degree of a variation of the first effective value Vr1 exceeds a first reference value Dref1 or not; and the determination processing of determining whether the degree of a variation of the second effective value Vr2 exceeds a second reference value Dref2 or not, determines the state of the signal to be measured S1 on the basis of a result of the determination at each determination processing, and makes a display section 7 display the state of the signal to be measured S1. COPYRIGHT: (C)2011,JPO&amp;INPIT</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDwdXUMDg3y9HNXcAwIcAxyDAkNVnD0c1FAiPu6hnj4u_AwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDQ0NDM2MLYwtHY6IUAQBaXiSg</recordid><startdate>20110825</startdate><enddate>20110825</enddate><creator>KOIKE SHINICHI</creator><scope>EVB</scope></search><sort><creationdate>20110825</creationdate><title>MEASURING APPARATUS AND MEASURING METHOD</title><author>KOIKE SHINICHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011163838A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KOIKE SHINICHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KOIKE SHINICHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MEASURING APPARATUS AND MEASURING METHOD</title><date>2011-08-25</date><risdate>2011</risdate><abstract>PROBLEM TO BE SOLVED: To detect an electric characteristic value of a signal to be measured and detect its state while avoiding a rise in the cost of the apparatus. SOLUTION: A measuring apparatus has a filter 3 for receiving an input of a signal to be measured S1 and passing only a frequency component within a measurement band. A measuring section 4 outputs an effective value of the signal to be measured S1 as a first effective value Vr1 and outputs the effective value of the signal to be measured S1 outputted from the filter section 3 as a second effective value Vr2. A processing section 5 executes the determination processing of determining whether both effective values Vr1 and Vr2 are matched with each other within an error range (specified range) De and whether the first effective value Vr1 exceeds the specified range and is larger than the second effective value Vr2 or not; the determination processing of determining whether the degree of a variation of the first effective value Vr1 exceeds a first reference value Dref1 or not; and the determination processing of determining whether the degree of a variation of the second effective value Vr2 exceeds a second reference value Dref2 or not, determines the state of the signal to be measured S1 on the basis of a result of the determination at each determination processing, and makes a display section 7 display the state of the signal to be measured S1. COPYRIGHT: (C)2011,JPO&amp;INPIT</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title MEASURING APPARATUS AND MEASURING METHOD
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T08%3A28%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KOIKE%20SHINICHI&rft.date=2011-08-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2011163838A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true