CONTACT PROBE
PROBLEM TO BE SOLVED: To provide a contact probe capable of suppressing heightening a resistance value without depending on its diameter even when being used at a high temperature. SOLUTION: In this contact probe including a cylindrical barrel, a plunger provided on the end of the barrel, and an ela...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a contact probe capable of suppressing heightening a resistance value without depending on its diameter even when being used at a high temperature. SOLUTION: In this contact probe including a cylindrical barrel, a plunger provided on the end of the barrel, and an elastic body stored in the barrel and energizing the plunger outward, the plunger includes: a substrate; a Ni-plated film formed on the surface of the substrate; an Au-plated film formed on the Ni-plated film; and an alloy middle film formed by being heated in a vacuum atmosphere, which is an alloy film interposed between the Ni-plated film and the Au-plated film and containing Au, Pd and Co, and the barrel includes an Au layer forming the inner circumference thereof, and a Ni layer forming the outer circumference of the barrel, and the barrel is formed by an electroforming method on the outer circumferential surface of a core wire having a prescribed diameter. COPYRIGHT: (C)2011,JPO&INPIT |
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