SUBSTRATE FOR MASS SPECTROMETRIC ANALYSIS, METHOD FOR PRODUCING SAME, AND MASS SPECTROMETRY

SUBSTRATE FOR MASS SPECTROMETRIC ANALYSIS, METHOD FOR PRODUCING SAME, AND MASS SPECTROMETRY

PROBLEM TO BE SOLVED: To provide a substrate for mass spectrometric analysis with which it is possible to further advance the performance of a matrix-free ionization method and to conduct analysis by laser desorption ionization-mass spectrometry without requiring the use of an ionizing agent which i...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ARAKAWA RYUICHI, MUROUCHI MASAHITO, KAWASAKI HIDEYA, TAMURA YUSUKE, MIZOGUCHI HIROTSUYO
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ARAKAWA RYUICHI
MUROUCHI MASAHITO
KAWASAKI HIDEYA
TAMURA YUSUKE
MIZOGUCHI HIROTSUYO
description PROBLEM TO BE SOLVED: To provide a substrate for mass spectrometric analysis with which it is possible to further advance the performance of a matrix-free ionization method and to conduct analysis by laser desorption ionization-mass spectrometry without requiring the use of an ionizing agent which is causative of noise or a decrease in detection sensitivity, and a method for producing the substrate. SOLUTION: The substrate for mass spectrometric analysis includes a base equipped thereon with a metal oxide to which an organic substance capable of supplying protons and/or cations is adherent. The method for producing the substrate for mass spectrometric analysis includes: coating the base with metal oxide dispersion obtained by dispersing the metal oxide with the aid of the organic substance capable of supplying protons and/or cations; and drying the coating. COPYRIGHT: (C)2011,JPO&INPIT
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2011033620A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2011033620A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2011033620A3</originalsourceid><addsrcrecordid>eNrjZIgODnUKDglyDHFVcPMPUvB1DA5WCA5wdQ4J8vd1DQnydFZw9HP0iQz2DNZRAAp4-LuA1QUE-buEOnv6uSsEO_q66gAVuWDojeRhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhoYGxsZmRgaOxkQpAgALHzKj</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SUBSTRATE FOR MASS SPECTROMETRIC ANALYSIS, METHOD FOR PRODUCING SAME, AND MASS SPECTROMETRY</title><source>esp@cenet</source><creator>ARAKAWA RYUICHI ; MUROUCHI MASAHITO ; KAWASAKI HIDEYA ; TAMURA YUSUKE ; MIZOGUCHI HIROTSUYO</creator><creatorcontrib>ARAKAWA RYUICHI ; MUROUCHI MASAHITO ; KAWASAKI HIDEYA ; TAMURA YUSUKE ; MIZOGUCHI HIROTSUYO</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a substrate for mass spectrometric analysis with which it is possible to further advance the performance of a matrix-free ionization method and to conduct analysis by laser desorption ionization-mass spectrometry without requiring the use of an ionizing agent which is causative of noise or a decrease in detection sensitivity, and a method for producing the substrate. SOLUTION: The substrate for mass spectrometric analysis includes a base equipped thereon with a metal oxide to which an organic substance capable of supplying protons and/or cations is adherent. The method for producing the substrate for mass spectrometric analysis includes: coating the base with metal oxide dispersion obtained by dispersing the metal oxide with the aid of the organic substance capable of supplying protons and/or cations; and drying the coating. COPYRIGHT: (C)2011,JPO&amp;INPIT</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110217&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011033620A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110217&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011033620A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ARAKAWA RYUICHI</creatorcontrib><creatorcontrib>MUROUCHI MASAHITO</creatorcontrib><creatorcontrib>KAWASAKI HIDEYA</creatorcontrib><creatorcontrib>TAMURA YUSUKE</creatorcontrib><creatorcontrib>MIZOGUCHI HIROTSUYO</creatorcontrib><title>SUBSTRATE FOR MASS SPECTROMETRIC ANALYSIS, METHOD FOR PRODUCING SAME, AND MASS SPECTROMETRY</title><description>PROBLEM TO BE SOLVED: To provide a substrate for mass spectrometric analysis with which it is possible to further advance the performance of a matrix-free ionization method and to conduct analysis by laser desorption ionization-mass spectrometry without requiring the use of an ionizing agent which is causative of noise or a decrease in detection sensitivity, and a method for producing the substrate. SOLUTION: The substrate for mass spectrometric analysis includes a base equipped thereon with a metal oxide to which an organic substance capable of supplying protons and/or cations is adherent. The method for producing the substrate for mass spectrometric analysis includes: coating the base with metal oxide dispersion obtained by dispersing the metal oxide with the aid of the organic substance capable of supplying protons and/or cations; and drying the coating. COPYRIGHT: (C)2011,JPO&amp;INPIT</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIgODnUKDglyDHFVcPMPUvB1DA5WCA5wdQ4J8vd1DQnydFZw9HP0iQz2DNZRAAp4-LuA1QUE-buEOnv6uSsEO_q66gAVuWDojeRhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhoYGxsZmRgaOxkQpAgALHzKj</recordid><startdate>20110217</startdate><enddate>20110217</enddate><creator>ARAKAWA RYUICHI</creator><creator>MUROUCHI MASAHITO</creator><creator>KAWASAKI HIDEYA</creator><creator>TAMURA YUSUKE</creator><creator>MIZOGUCHI HIROTSUYO</creator><scope>EVB</scope></search><sort><creationdate>20110217</creationdate><title>SUBSTRATE FOR MASS SPECTROMETRIC ANALYSIS, METHOD FOR PRODUCING SAME, AND MASS SPECTROMETRY</title><author>ARAKAWA RYUICHI ; MUROUCHI MASAHITO ; KAWASAKI HIDEYA ; TAMURA YUSUKE ; MIZOGUCHI HIROTSUYO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011033620A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ARAKAWA RYUICHI</creatorcontrib><creatorcontrib>MUROUCHI MASAHITO</creatorcontrib><creatorcontrib>KAWASAKI HIDEYA</creatorcontrib><creatorcontrib>TAMURA YUSUKE</creatorcontrib><creatorcontrib>MIZOGUCHI HIROTSUYO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ARAKAWA RYUICHI</au><au>MUROUCHI MASAHITO</au><au>KAWASAKI HIDEYA</au><au>TAMURA YUSUKE</au><au>MIZOGUCHI HIROTSUYO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SUBSTRATE FOR MASS SPECTROMETRIC ANALYSIS, METHOD FOR PRODUCING SAME, AND MASS SPECTROMETRY</title><date>2011-02-17</date><risdate>2011</risdate><abstract>PROBLEM TO BE SOLVED: To provide a substrate for mass spectrometric analysis with which it is possible to further advance the performance of a matrix-free ionization method and to conduct analysis by laser desorption ionization-mass spectrometry without requiring the use of an ionizing agent which is causative of noise or a decrease in detection sensitivity, and a method for producing the substrate. SOLUTION: The substrate for mass spectrometric analysis includes a base equipped thereon with a metal oxide to which an organic substance capable of supplying protons and/or cations is adherent. The method for producing the substrate for mass spectrometric analysis includes: coating the base with metal oxide dispersion obtained by dispersing the metal oxide with the aid of the organic substance capable of supplying protons and/or cations; and drying the coating. COPYRIGHT: (C)2011,JPO&amp;INPIT</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2011033620A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SUBSTRATE FOR MASS SPECTROMETRIC ANALYSIS, METHOD FOR PRODUCING SAME, AND MASS SPECTROMETRY
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T20%3A53%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ARAKAWA%20RYUICHI&rft.date=2011-02-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2011033620A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true