ENCODER

PROBLEM TO BE SOLVED: To reduce the size of a device when an encoder is installed in the predetermined device. SOLUTION: A main scale 31 of a linear encoder 25 is provided with a pattern 91-1 and a pattern 91-2. The pattern 91-1 and the pattern 91-2, respectively, connect a control device 22 for con...

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description PROBLEM TO BE SOLVED: To reduce the size of a device when an encoder is installed in the predetermined device. SOLUTION: A main scale 31 of a linear encoder 25 is provided with a pattern 91-1 and a pattern 91-2. The pattern 91-1 and the pattern 91-2, respectively, connect a control device 22 for controlling a stage with a deceleration region sensor 34-1 for detecting the arrival of the stage to a deceleration position and a stroke end sensor 33-1 for detecting the arrival of the stage to a termination position. The main scale 31 is further provided with a pattern 91-3 and a pattern 91-4. The pattern 91-3 and the pattern 91-4 each electrically connect a power supply 24 with both the deceleration region sensor 34-1 and the stroke end sensor 33-1. Accordingly electric wires for connecting the deceleration region sensor 34-1 and the stroke end sensor 33-1 with the control device 22 and the power supply 24 can be shortened, whereby the device provided with the linear encoder 25 can be reduced in size. The present invention is applicable to the linear encoder. COPYRIGHT: (C)2011,JPO&INPIT
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2011021963A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2011021963A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2011021963A3</originalsourceid><addsrcrecordid>eNrjZGB39XP2d3EN4mFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaGhgZGhpZmxo7GRCkCADUYG1Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ENCODER</title><source>esp@cenet</source><creator>USAMI HITOSHI</creator><creatorcontrib>USAMI HITOSHI</creatorcontrib><description>PROBLEM TO BE SOLVED: To reduce the size of a device when an encoder is installed in the predetermined device. SOLUTION: A main scale 31 of a linear encoder 25 is provided with a pattern 91-1 and a pattern 91-2. The pattern 91-1 and the pattern 91-2, respectively, connect a control device 22 for controlling a stage with a deceleration region sensor 34-1 for detecting the arrival of the stage to a deceleration position and a stroke end sensor 33-1 for detecting the arrival of the stage to a termination position. The main scale 31 is further provided with a pattern 91-3 and a pattern 91-4. The pattern 91-3 and the pattern 91-4 each electrically connect a power supply 24 with both the deceleration region sensor 34-1 and the stroke end sensor 33-1. Accordingly electric wires for connecting the deceleration region sensor 34-1 and the stroke end sensor 33-1 with the control device 22 and the power supply 24 can be shortened, whereby the device provided with the linear encoder 25 can be reduced in size. The present invention is applicable to the linear encoder. COPYRIGHT: (C)2011,JPO&amp;INPIT</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110203&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011021963A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110203&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011021963A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>USAMI HITOSHI</creatorcontrib><title>ENCODER</title><description>PROBLEM TO BE SOLVED: To reduce the size of a device when an encoder is installed in the predetermined device. SOLUTION: A main scale 31 of a linear encoder 25 is provided with a pattern 91-1 and a pattern 91-2. The pattern 91-1 and the pattern 91-2, respectively, connect a control device 22 for controlling a stage with a deceleration region sensor 34-1 for detecting the arrival of the stage to a deceleration position and a stroke end sensor 33-1 for detecting the arrival of the stage to a termination position. The main scale 31 is further provided with a pattern 91-3 and a pattern 91-4. The pattern 91-3 and the pattern 91-4 each electrically connect a power supply 24 with both the deceleration region sensor 34-1 and the stroke end sensor 33-1. Accordingly electric wires for connecting the deceleration region sensor 34-1 and the stroke end sensor 33-1 with the control device 22 and the power supply 24 can be shortened, whereby the device provided with the linear encoder 25 can be reduced in size. The present invention is applicable to the linear encoder. COPYRIGHT: (C)2011,JPO&amp;INPIT</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZGB39XP2d3EN4mFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaGhgZGhpZmxo7GRCkCADUYG1Q</recordid><startdate>20110203</startdate><enddate>20110203</enddate><creator>USAMI HITOSHI</creator><scope>EVB</scope></search><sort><creationdate>20110203</creationdate><title>ENCODER</title><author>USAMI HITOSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011021963A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>USAMI HITOSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>USAMI HITOSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ENCODER</title><date>2011-02-03</date><risdate>2011</risdate><abstract>PROBLEM TO BE SOLVED: To reduce the size of a device when an encoder is installed in the predetermined device. SOLUTION: A main scale 31 of a linear encoder 25 is provided with a pattern 91-1 and a pattern 91-2. The pattern 91-1 and the pattern 91-2, respectively, connect a control device 22 for controlling a stage with a deceleration region sensor 34-1 for detecting the arrival of the stage to a deceleration position and a stroke end sensor 33-1 for detecting the arrival of the stage to a termination position. The main scale 31 is further provided with a pattern 91-3 and a pattern 91-4. The pattern 91-3 and the pattern 91-4 each electrically connect a power supply 24 with both the deceleration region sensor 34-1 and the stroke end sensor 33-1. Accordingly electric wires for connecting the deceleration region sensor 34-1 and the stroke end sensor 33-1 with the control device 22 and the power supply 24 can be shortened, whereby the device provided with the linear encoder 25 can be reduced in size. The present invention is applicable to the linear encoder. COPYRIGHT: (C)2011,JPO&amp;INPIT</abstract><oa>free_for_read</oa></addata></record>
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
title ENCODER
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