SEMICONDUCTOR INTEGRATED CIRCUIT
PROBLEM TO BE SOLVED: To detect erroneous operation, even with respect to an attack that makes a plurality of parts misoperate simultaneously. SOLUTION: In this semiconductor integrated circuit, a misoperation processing circuit 1237 includes: a specified period operation circuit (1120) repeatedly c...
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| creator | OTA SHUNSUKE ENDO TAKASHI TSUKAMOTO TAKU NARIYOSHI YUICHIRO |
| description | PROBLEM TO BE SOLVED: To detect erroneous operation, even with respect to an attack that makes a plurality of parts misoperate simultaneously. SOLUTION: In this semiconductor integrated circuit, a misoperation processing circuit 1237 includes: a specified period operation circuit (1120) repeatedly calculating a data string generated based on kind data, during a specific period; and a first misoperation detection circuit (4110) detecting that a period needed for the calculation of the data string in operation thereof is different from the specified period. The erroneous operation processing circuit includes a second misoperation detection circuit (4111) detecting that the data that are not generated from the kind data, i.e., abnormal data are obtained in the specified period operation circuit. The misoperation processing circuit also includes a misoperation result processing circuit (1160) restricting the operation of a CPU, when at least one of a first misoperation detection signal and a second misoperation detection signal is asserted. The semiconductor integrated circuit adopts a detection system using a characteristic of state transition of data or periodicity of internal data. COPYRIGHT: (C)2010,JPO&INPIT |
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SOLUTION: In this semiconductor integrated circuit, a misoperation processing circuit 1237 includes: a specified period operation circuit (1120) repeatedly calculating a data string generated based on kind data, during a specific period; and a first misoperation detection circuit (4110) detecting that a period needed for the calculation of the data string in operation thereof is different from the specified period. The erroneous operation processing circuit includes a second misoperation detection circuit (4111) detecting that the data that are not generated from the kind data, i.e., abnormal data are obtained in the specified period operation circuit. The misoperation processing circuit also includes a misoperation result processing circuit (1160) restricting the operation of a CPU, when at least one of a first misoperation detection signal and a second misoperation detection signal is asserted. The semiconductor integrated circuit adopts a detection system using a characteristic of state transition of data or periodicity of internal data. 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SOLUTION: In this semiconductor integrated circuit, a misoperation processing circuit 1237 includes: a specified period operation circuit (1120) repeatedly calculating a data string generated based on kind data, during a specific period; and a first misoperation detection circuit (4110) detecting that a period needed for the calculation of the data string in operation thereof is different from the specified period. The erroneous operation processing circuit includes a second misoperation detection circuit (4111) detecting that the data that are not generated from the kind data, i.e., abnormal data are obtained in the specified period operation circuit. The misoperation processing circuit also includes a misoperation result processing circuit (1160) restricting the operation of a CPU, when at least one of a first misoperation detection signal and a second misoperation detection signal is asserted. The semiconductor integrated circuit adopts a detection system using a characteristic of state transition of data or periodicity of internal data. COPYRIGHT: (C)2010,JPO&INPIT</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>HANDLING RECORD CARRIERS</subject><subject>PHYSICS</subject><subject>PRESENTATION OF DATA</subject><subject>RECOGNITION OF DATA</subject><subject>RECORD CARRIERS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAIdvX1dPb3cwl1DvEPUvD0C3F1D3IMcXVRcPYMcg71DOFhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhgaGloamhkaOxkQpAgBQniKA</recordid><startdate>20100902</startdate><enddate>20100902</enddate><creator>OTA SHUNSUKE</creator><creator>ENDO TAKASHI</creator><creator>TSUKAMOTO TAKU</creator><creator>NARIYOSHI YUICHIRO</creator><scope>EVB</scope></search><sort><creationdate>20100902</creationdate><title>SEMICONDUCTOR INTEGRATED CIRCUIT</title><author>OTA SHUNSUKE ; ENDO TAKASHI ; TSUKAMOTO TAKU ; NARIYOSHI YUICHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2010191512A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>HANDLING RECORD CARRIERS</topic><topic>PHYSICS</topic><topic>PRESENTATION OF DATA</topic><topic>RECOGNITION OF DATA</topic><topic>RECORD CARRIERS</topic><toplevel>online_resources</toplevel><creatorcontrib>OTA SHUNSUKE</creatorcontrib><creatorcontrib>ENDO TAKASHI</creatorcontrib><creatorcontrib>TSUKAMOTO TAKU</creatorcontrib><creatorcontrib>NARIYOSHI YUICHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OTA SHUNSUKE</au><au>ENDO TAKASHI</au><au>TSUKAMOTO TAKU</au><au>NARIYOSHI YUICHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SEMICONDUCTOR INTEGRATED CIRCUIT</title><date>2010-09-02</date><risdate>2010</risdate><abstract>PROBLEM TO BE SOLVED: To detect erroneous operation, even with respect to an attack that makes a plurality of parts misoperate simultaneously. SOLUTION: In this semiconductor integrated circuit, a misoperation processing circuit 1237 includes: a specified period operation circuit (1120) repeatedly calculating a data string generated based on kind data, during a specific period; and a first misoperation detection circuit (4110) detecting that a period needed for the calculation of the data string in operation thereof is different from the specified period. The erroneous operation processing circuit includes a second misoperation detection circuit (4111) detecting that the data that are not generated from the kind data, i.e., abnormal data are obtained in the specified period operation circuit. The misoperation processing circuit also includes a misoperation result processing circuit (1160) restricting the operation of a CPU, when at least one of a first misoperation detection signal and a second misoperation detection signal is asserted. The semiconductor integrated circuit adopts a detection system using a characteristic of state transition of data or periodicity of internal data. COPYRIGHT: (C)2010,JPO&INPIT</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING HANDLING RECORD CARRIERS PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS |
| title | SEMICONDUCTOR INTEGRATED CIRCUIT |
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