CT SYSTEM

CT SYSTEM

PROBLEM TO BE SOLVED: To provide a CT (Computed Tomography) device easily matching a focused part of an analyte to the rotation axis. SOLUTION: This CT system includes an XY mechanism 6 for moving a table 4 in the xy direction, a lifting mechanism 7 for moving it in the z direction, a display sectio...

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Hauptverfasser: UYAMA KIICHIRO, YAMAKAGE YOHEI, FUJII MASAJI, IWAZAWA JUNICHI, YAMAMOTO TERUO
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator UYAMA KIICHIRO
YAMAKAGE YOHEI
FUJII MASAJI
IWAZAWA JUNICHI
YAMAMOTO TERUO
description PROBLEM TO BE SOLVED: To provide a CT (Computed Tomography) device easily matching a focused part of an analyte to the rotation axis. SOLUTION: This CT system includes an XY mechanism 6 for moving a table 4 in the xy direction, a lifting mechanism 7 for moving it in the z direction, a display section 9a for displaying a first transmission image detected by an X-ray detector 3 at a certain rotation position. When the focused part is set on the first transmission image by an ROI (Region of Interest) setting section 9c for receiving the setting the focused part on the first transmission image displayed on the display section 9a, the XY mechanism 6 is controlled by a movement control section 9d to move the table 4 by a predetermined distance xy, or the lifting mechanism 7 is controlled to move the table 4 by a predetermined distance z and a second transmission image is detected by the X-ray detector 3, the moving amount of the focused part on the transmission image is determined based on the first transmission image and the second transmission image, a position along the xy plane of the focused part is determined based on the determined moving amount on the transmission image, and the XY mechanism 6 is controlled to xy-move the table 4 so as to match the focused part onto the rotation axis RA. COPYRIGHT: (C)2010,JPO&INPIT
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title CT SYSTEM
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