INFRARED DETECTION DEVICE

PROBLEM TO BE SOLVED: To enable the increase of the supporting strength of a supporting body of an infrared detection part of an infrared imaging device. SOLUTION: The infrared detection part mounted on an insulation member above a cavity formed on the main surface of a silicon substrate, and a brid...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: NAKANISHI JUNJI, ISHIKAWA TOMOHIRO, KANEDA OSAMU
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator NAKANISHI JUNJI
ISHIKAWA TOMOHIRO
KANEDA OSAMU
description PROBLEM TO BE SOLVED: To enable the increase of the supporting strength of a supporting body of an infrared detection part of an infrared imaging device. SOLUTION: The infrared detection part mounted on an insulation member above a cavity formed on the main surface of a silicon substrate, and a bridge part supporting the insulation member above the cavity are included. The cross-sectional shape of the insulation member is adapted to have a step. Therefore, the second moment of area of the insulation member can be increased, and the rigidity of the insulation member as a supporting body for supporting the infrared detection part can be increased. This kind of structure is resistant to vibration, and can be used for the infrared imaging device suitable for transportable application such as monitoring application or the like. COPYRIGHT: (C)2010,JPO&INPIT
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2009244282A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2009244282A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2009244282A3</originalsourceid><addsrcrecordid>eNrjZJD09HMLcgxydVFwcQ1xdQ7x9PcDssI8nV15GFjTEnOKU3mhNDeDkptriLOHbmpBfnxqcUFicmpeakm8V4CRgYGlkYmJkYWRozFRigBGoSBQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INFRARED DETECTION DEVICE</title><source>esp@cenet</source><creator>NAKANISHI JUNJI ; ISHIKAWA TOMOHIRO ; KANEDA OSAMU</creator><creatorcontrib>NAKANISHI JUNJI ; ISHIKAWA TOMOHIRO ; KANEDA OSAMU</creatorcontrib><description>PROBLEM TO BE SOLVED: To enable the increase of the supporting strength of a supporting body of an infrared detection part of an infrared imaging device. SOLUTION: The infrared detection part mounted on an insulation member above a cavity formed on the main surface of a silicon substrate, and a bridge part supporting the insulation member above the cavity are included. The cross-sectional shape of the insulation member is adapted to have a step. Therefore, the second moment of area of the insulation member can be increased, and the rigidity of the insulation member as a supporting body for supporting the infrared detection part can be increased. This kind of structure is resistant to vibration, and can be used for the infrared imaging device suitable for transportable application such as monitoring application or the like. COPYRIGHT: (C)2010,JPO&amp;INPIT</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; COLORIMETRY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20091022&amp;DB=EPODOC&amp;CC=JP&amp;NR=2009244282A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20091022&amp;DB=EPODOC&amp;CC=JP&amp;NR=2009244282A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAKANISHI JUNJI</creatorcontrib><creatorcontrib>ISHIKAWA TOMOHIRO</creatorcontrib><creatorcontrib>KANEDA OSAMU</creatorcontrib><title>INFRARED DETECTION DEVICE</title><description>PROBLEM TO BE SOLVED: To enable the increase of the supporting strength of a supporting body of an infrared detection part of an infrared imaging device. SOLUTION: The infrared detection part mounted on an insulation member above a cavity formed on the main surface of a silicon substrate, and a bridge part supporting the insulation member above the cavity are included. The cross-sectional shape of the insulation member is adapted to have a step. Therefore, the second moment of area of the insulation member can be increased, and the rigidity of the insulation member as a supporting body for supporting the infrared detection part can be increased. This kind of structure is resistant to vibration, and can be used for the infrared imaging device suitable for transportable application such as monitoring application or the like. COPYRIGHT: (C)2010,JPO&amp;INPIT</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>COLORIMETRY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD09HMLcgxydVFwcQ1xdQ7x9PcDssI8nV15GFjTEnOKU3mhNDeDkptriLOHbmpBfnxqcUFicmpeakm8V4CRgYGlkYmJkYWRozFRigBGoSBQ</recordid><startdate>20091022</startdate><enddate>20091022</enddate><creator>NAKANISHI JUNJI</creator><creator>ISHIKAWA TOMOHIRO</creator><creator>KANEDA OSAMU</creator><scope>EVB</scope></search><sort><creationdate>20091022</creationdate><title>INFRARED DETECTION DEVICE</title><author>NAKANISHI JUNJI ; ISHIKAWA TOMOHIRO ; KANEDA OSAMU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2009244282A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>COLORIMETRY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKANISHI JUNJI</creatorcontrib><creatorcontrib>ISHIKAWA TOMOHIRO</creatorcontrib><creatorcontrib>KANEDA OSAMU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKANISHI JUNJI</au><au>ISHIKAWA TOMOHIRO</au><au>KANEDA OSAMU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INFRARED DETECTION DEVICE</title><date>2009-10-22</date><risdate>2009</risdate><abstract>PROBLEM TO BE SOLVED: To enable the increase of the supporting strength of a supporting body of an infrared detection part of an infrared imaging device. SOLUTION: The infrared detection part mounted on an insulation member above a cavity formed on the main surface of a silicon substrate, and a bridge part supporting the insulation member above the cavity are included. The cross-sectional shape of the insulation member is adapted to have a step. Therefore, the second moment of area of the insulation member can be increased, and the rigidity of the insulation member as a supporting body for supporting the infrared detection part can be increased. This kind of structure is resistant to vibration, and can be used for the infrared imaging device suitable for transportable application such as monitoring application or the like. COPYRIGHT: (C)2010,JPO&amp;INPIT</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2009244282A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
COLORIMETRY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
SEMICONDUCTOR DEVICES
TESTING
title INFRARED DETECTION DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T16%3A47%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAKANISHI%20JUNJI&rft.date=2009-10-22&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2009244282A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true