METHOD FOR MEASURING ONE OR MORE SPECIFIC PARAMETER VALUE OF CHROMATOGRAPHIC SYSTEM

METHOD FOR MEASURING ONE OR MORE SPECIFIC PARAMETER VALUE OF CHROMATOGRAPHIC SYSTEM

PROBLEM TO BE SOLVED: To provide a novel method and means for optimizing parameters for a chromatographic system. SOLUTION: The method for determining one or more specific parameter values of the chromatographic system has steps of operating the chromatographic system to generate an index, providing...

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Hauptverfasser: TIPLER ANDREW, CAHILL JERRY E, PATKIN ADAM J, BAJORINAS ANDREW J, CARTER RALPH
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator TIPLER ANDREW
CAHILL JERRY E
PATKIN ADAM J
BAJORINAS ANDREW J
CARTER RALPH
description PROBLEM TO BE SOLVED: To provide a novel method and means for optimizing parameters for a chromatographic system. SOLUTION: The method for determining one or more specific parameter values of the chromatographic system has steps of operating the chromatographic system to generate an index, providing a database for defining a range of values that the specific parameters can take, computing the theoretical index of a sample component by a mathematical function with the value that the specific parameter can take, computing the difference between the theoretical index and a secondary index to the retention time or retention index of the sample component, and searching for the minimum value of the difference to allow the minimum value to establish the effective value of each specific parameter for carrying out chromatography. COPYRIGHT: (C)2009,JPO&INPIT
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD FOR MEASURING ONE OR MORE SPECIFIC PARAMETER VALUE OF CHROMATOGRAPHIC SYSTEM
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