METHOD AND DEVICE FOR DETECTING FLAW OF INSPECTING OBJECT, AND PROBE FOR EDDY CURRENT FLAW DETECTION

METHOD AND DEVICE FOR DETECTING FLAW OF INSPECTING OBJECT, AND PROBE FOR EDDY CURRENT FLAW DETECTION

PROBLEM TO BE SOLVED: To provide a flaw detection method that readily enables giving magnetic fields of two directions to be provided easily to an inspecting object, using a simple configuration, and can detect flaws in any direction. SOLUTION: Two coils 21 and 22, whose cross section has a rectangu...

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Hauptverfasser: NAKANO KOICHI, HIROSHIMA TATSUO
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Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator NAKANO KOICHI
HIROSHIMA TATSUO
description PROBLEM TO BE SOLVED: To provide a flaw detection method that readily enables giving magnetic fields of two directions to be provided easily to an inspecting object, using a simple configuration, and can detect flaws in any direction. SOLUTION: Two coils 21 and 22, whose cross section has a rectangular shape that forms an exciting coil 11B, alternating currents, mutually having a phase difference of 90°, are made to flow in two coils to generate a rotation magnetic field; the rotating magnetic field generates eddy current on the surface of the measuring object WK2 that penetrates the two coils; and a magnetism detecting element 12, arranged at a location where two coils cross each other, performs eddy current flaw detection. COPYRIGHT: (C)2009,JPO&INPIT
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2009069090A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2009069090A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2009069090A3</originalsourceid><addsrcrecordid>eNrjZEjxdQ3x8HdRcPRzUXBxDfN0dlVw8w8CMkNcnUM8_dwV3HwcwxX83RQ8_YIDoEL-Tl5Alg5YT0CQvxNEi6uLS6SCc2hQkKtfCEQX1BB_Px4G1rTEnOJUXijNzaDk5hri7KGbWpAfn1pckJicmpdaEu8VYGRgYGlgZgkkHI2JUgQAR2c0QQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND DEVICE FOR DETECTING FLAW OF INSPECTING OBJECT, AND PROBE FOR EDDY CURRENT FLAW DETECTION</title><source>esp@cenet</source><creator>NAKANO KOICHI ; HIROSHIMA TATSUO</creator><creatorcontrib>NAKANO KOICHI ; HIROSHIMA TATSUO</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a flaw detection method that readily enables giving magnetic fields of two directions to be provided easily to an inspecting object, using a simple configuration, and can detect flaws in any direction. SOLUTION: Two coils 21 and 22, whose cross section has a rectangular shape that forms an exciting coil 11B, alternating currents, mutually having a phase difference of 90°, are made to flow in two coils to generate a rotation magnetic field; the rotating magnetic field generates eddy current on the surface of the measuring object WK2 that penetrates the two coils; and a magnetism detecting element 12, arranged at a location where two coils cross each other, performs eddy current flaw detection. COPYRIGHT: (C)2009,JPO&amp;INPIT</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090402&amp;DB=EPODOC&amp;CC=JP&amp;NR=2009069090A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20090402&amp;DB=EPODOC&amp;CC=JP&amp;NR=2009069090A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAKANO KOICHI</creatorcontrib><creatorcontrib>HIROSHIMA TATSUO</creatorcontrib><title>METHOD AND DEVICE FOR DETECTING FLAW OF INSPECTING OBJECT, AND PROBE FOR EDDY CURRENT FLAW DETECTION</title><description>PROBLEM TO BE SOLVED: To provide a flaw detection method that readily enables giving magnetic fields of two directions to be provided easily to an inspecting object, using a simple configuration, and can detect flaws in any direction. SOLUTION: Two coils 21 and 22, whose cross section has a rectangular shape that forms an exciting coil 11B, alternating currents, mutually having a phase difference of 90°, are made to flow in two coils to generate a rotation magnetic field; the rotating magnetic field generates eddy current on the surface of the measuring object WK2 that penetrates the two coils; and a magnetism detecting element 12, arranged at a location where two coils cross each other, performs eddy current flaw detection. COPYRIGHT: (C)2009,JPO&amp;INPIT</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZEjxdQ3x8HdRcPRzUXBxDfN0dlVw8w8CMkNcnUM8_dwV3HwcwxX83RQ8_YIDoEL-Tl5Alg5YT0CQvxNEi6uLS6SCc2hQkKtfCEQX1BB_Px4G1rTEnOJUXijNzaDk5hri7KGbWpAfn1pckJicmpdaEu8VYGRgYGlgZgkkHI2JUgQAR2c0QQ</recordid><startdate>20090402</startdate><enddate>20090402</enddate><creator>NAKANO KOICHI</creator><creator>HIROSHIMA TATSUO</creator><scope>EVB</scope></search><sort><creationdate>20090402</creationdate><title>METHOD AND DEVICE FOR DETECTING FLAW OF INSPECTING OBJECT, AND PROBE FOR EDDY CURRENT FLAW DETECTION</title><author>NAKANO KOICHI ; HIROSHIMA TATSUO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2009069090A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAKANO KOICHI</creatorcontrib><creatorcontrib>HIROSHIMA TATSUO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAKANO KOICHI</au><au>HIROSHIMA TATSUO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND DEVICE FOR DETECTING FLAW OF INSPECTING OBJECT, AND PROBE FOR EDDY CURRENT FLAW DETECTION</title><date>2009-04-02</date><risdate>2009</risdate><abstract>PROBLEM TO BE SOLVED: To provide a flaw detection method that readily enables giving magnetic fields of two directions to be provided easily to an inspecting object, using a simple configuration, and can detect flaws in any direction. SOLUTION: Two coils 21 and 22, whose cross section has a rectangular shape that forms an exciting coil 11B, alternating currents, mutually having a phase difference of 90°, are made to flow in two coils to generate a rotation magnetic field; the rotating magnetic field generates eddy current on the surface of the measuring object WK2 that penetrates the two coils; and a magnetism detecting element 12, arranged at a location where two coils cross each other, performs eddy current flaw detection. COPYRIGHT: (C)2009,JPO&amp;INPIT</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD AND DEVICE FOR DETECTING FLAW OF INSPECTING OBJECT, AND PROBE FOR EDDY CURRENT FLAW DETECTION
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T20%3A54%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAKANO%20KOICHI&rft.date=2009-04-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2009069090A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true