ANALYSIS METHOD OF LATTICE DEFECT IN TITANIUM DIOXIDE

ANALYSIS METHOD OF LATTICE DEFECT IN TITANIUM DIOXIDE

PROBLEM TO BE SOLVED: To provide an analysis method of titanium dioxide capable of independently analyzing the lattice defect existing on the surface of a crystal lattice, on an interface of the crystal lattice, or in amorphous material, and the lattice defect existing inside the crystal lattice. SO...

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Hauptverfasser: OTANI FUMIAKI, SUYASU YUKO, ANDO HIROYUKI
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Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator OTANI FUMIAKI
SUYASU YUKO
ANDO HIROYUKI
description PROBLEM TO BE SOLVED: To provide an analysis method of titanium dioxide capable of independently analyzing the lattice defect existing on the surface of a crystal lattice, on an interface of the crystal lattice, or in amorphous material, and the lattice defect existing inside the crystal lattice. SOLUTION: The titanium dioxide is irradiated with light in the state of anoxia under the existence of triethanolamine, then ESR spectrum is measured, spin concentration of a peak component in the acquired EPR spectrum is determined, and the position of the lattice defect is specified using a g value where the peak top of the peak component exists. In detail, by determining the spin concentration (S1) of a first peak component (P1) having the peak top in the range 1.92-1.94 of g value, the lattice defect existing on the surface of the crystal lattice, on the interface of the crystal lattice, or in amorphous material is analyzed. By determining the spin concentration (S2) of a second peak component (P2) having the peak top in the range 1.95-1.97 of g value, the lattice defect existing inside the crystal lattice is analyzed. COPYRIGHT: (C)2009,JPO&INPIT
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SOLUTION: The titanium dioxide is irradiated with light in the state of anoxia under the existence of triethanolamine, then ESR spectrum is measured, spin concentration of a peak component in the acquired EPR spectrum is determined, and the position of the lattice defect is specified using a g value where the peak top of the peak component exists. In detail, by determining the spin concentration (S1) of a first peak component (P1) having the peak top in the range 1.92-1.94 of g value, the lattice defect existing on the surface of the crystal lattice, on the interface of the crystal lattice, or in amorphous material is analyzed. By determining the spin concentration (S2) of a second peak component (P2) having the peak top in the range 1.95-1.97 of g value, the lattice defect existing inside the crystal lattice is analyzed. 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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title ANALYSIS METHOD OF LATTICE DEFECT IN TITANIUM DIOXIDE
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