CRYSTAL ELEMENT ASSEMBLY, ELECTRICAL CIRCUIT THEREFOR, NUCLEAR MEDICINE DIAGNOSTIC DEVICE USING THEM, AND ENERGIZATION CONTROL METHOD

CRYSTAL ELEMENT ASSEMBLY, ELECTRICAL CIRCUIT THEREFOR, NUCLEAR MEDICINE DIAGNOSTIC DEVICE USING THEM, AND ENERGIZATION CONTROL METHOD

PROBLEM TO BE SOLVED: To provide a nuclear medicine diagnostic device excelling in energy resolution and a nuclear medicine diagnostic method. SOLUTION: This nuclear medicine diagnostic device has a bonded structure made by bonding a semiconductor element S and conductive members 22A, 22B, 23A, and...

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Hauptverfasser: KIYONO TOMOYUKI, TAKAHASHI ISAO, YANAGIDA NORIFUMI
Format: Patent
Sprache:eng
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BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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creator KIYONO TOMOYUKI
TAKAHASHI ISAO
YANAGIDA NORIFUMI
description PROBLEM TO BE SOLVED: To provide a nuclear medicine diagnostic device excelling in energy resolution and a nuclear medicine diagnostic method. SOLUTION: This nuclear medicine diagnostic device has a bonded structure made by bonding a semiconductor element S and conductive members 22A, 22B, 23A, and 23B with conductive adhesion material 24 composed of conductive particles and a resin binder. This device is equipped with a structure in which electric charge is picked up as a signal from the conductive members 22A, 22B, 23A, and 23B, via the adhesion material 24, through a detection circuit 40, the electric charge being induced when γ rays enter the semiconductor element S, and an energization control means 30 for passing an electric current through at least the adhesion material 24, the electric current being larger than an electric current caused by the electric charge induced when the γ rays enter. COPYRIGHT: (C)2009,JPO&INPIT
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2008286560A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2008286560A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2008286560A3</originalsourceid><addsrcrecordid>eNqNizEKwkAQRdNYiHqHwTpCUJS06-wkGdnMyu5E0EaCrJWooFfw3ip4AKsH__03zF4Y9lGNA3LUkiiYGKldu33-XVAD40ciB-xYQRsKVPmQg3ToyARoyTKyEFg2tfiojGBpx0jQRZb6m7Q5GLFAQqHmg1H2AuhFg3efXhtvx9ng3F8eafLjKJtWpNjM0v12TI97f0rX9DxutvOiKOflarkqzOKv0xsUHz35</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CRYSTAL ELEMENT ASSEMBLY, ELECTRICAL CIRCUIT THEREFOR, NUCLEAR MEDICINE DIAGNOSTIC DEVICE USING THEM, AND ENERGIZATION CONTROL METHOD</title><source>esp@cenet</source><creator>KIYONO TOMOYUKI ; TAKAHASHI ISAO ; YANAGIDA NORIFUMI</creator><creatorcontrib>KIYONO TOMOYUKI ; TAKAHASHI ISAO ; YANAGIDA NORIFUMI</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a nuclear medicine diagnostic device excelling in energy resolution and a nuclear medicine diagnostic method. SOLUTION: This nuclear medicine diagnostic device has a bonded structure made by bonding a semiconductor element S and conductive members 22A, 22B, 23A, and 23B with conductive adhesion material 24 composed of conductive particles and a resin binder. This device is equipped with a structure in which electric charge is picked up as a signal from the conductive members 22A, 22B, 23A, and 23B, via the adhesion material 24, through a detection circuit 40, the electric charge being induced when γ rays enter the semiconductor element S, and an energization control means 30 for passing an electric current through at least the adhesion material 24, the electric current being larger than an electric current caused by the electric charge induced when the γ rays enter. COPYRIGHT: (C)2009,JPO&amp;INPIT</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081127&amp;DB=EPODOC&amp;CC=JP&amp;NR=2008286560A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20081127&amp;DB=EPODOC&amp;CC=JP&amp;NR=2008286560A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KIYONO TOMOYUKI</creatorcontrib><creatorcontrib>TAKAHASHI ISAO</creatorcontrib><creatorcontrib>YANAGIDA NORIFUMI</creatorcontrib><title>CRYSTAL ELEMENT ASSEMBLY, ELECTRICAL CIRCUIT THEREFOR, NUCLEAR MEDICINE DIAGNOSTIC DEVICE USING THEM, AND ENERGIZATION CONTROL METHOD</title><description>PROBLEM TO BE SOLVED: To provide a nuclear medicine diagnostic device excelling in energy resolution and a nuclear medicine diagnostic method. SOLUTION: This nuclear medicine diagnostic device has a bonded structure made by bonding a semiconductor element S and conductive members 22A, 22B, 23A, and 23B with conductive adhesion material 24 composed of conductive particles and a resin binder. This device is equipped with a structure in which electric charge is picked up as a signal from the conductive members 22A, 22B, 23A, and 23B, via the adhesion material 24, through a detection circuit 40, the electric charge being induced when γ rays enter the semiconductor element S, and an energization control means 30 for passing an electric current through at least the adhesion material 24, the electric current being larger than an electric current caused by the electric charge induced when the γ rays enter. COPYRIGHT: (C)2009,JPO&amp;INPIT</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNizEKwkAQRdNYiHqHwTpCUJS06-wkGdnMyu5E0EaCrJWooFfw3ip4AKsH__03zF4Y9lGNA3LUkiiYGKldu33-XVAD40ciB-xYQRsKVPmQg3ToyARoyTKyEFg2tfiojGBpx0jQRZb6m7Q5GLFAQqHmg1H2AuhFg3efXhtvx9ng3F8eafLjKJtWpNjM0v12TI97f0rX9DxutvOiKOflarkqzOKv0xsUHz35</recordid><startdate>20081127</startdate><enddate>20081127</enddate><creator>KIYONO TOMOYUKI</creator><creator>TAKAHASHI ISAO</creator><creator>YANAGIDA NORIFUMI</creator><scope>EVB</scope></search><sort><creationdate>20081127</creationdate><title>CRYSTAL ELEMENT ASSEMBLY, ELECTRICAL CIRCUIT THEREFOR, NUCLEAR MEDICINE DIAGNOSTIC DEVICE USING THEM, AND ENERGIZATION CONTROL METHOD</title><author>KIYONO TOMOYUKI ; TAKAHASHI ISAO ; YANAGIDA NORIFUMI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2008286560A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KIYONO TOMOYUKI</creatorcontrib><creatorcontrib>TAKAHASHI ISAO</creatorcontrib><creatorcontrib>YANAGIDA NORIFUMI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KIYONO TOMOYUKI</au><au>TAKAHASHI ISAO</au><au>YANAGIDA NORIFUMI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CRYSTAL ELEMENT ASSEMBLY, ELECTRICAL CIRCUIT THEREFOR, NUCLEAR MEDICINE DIAGNOSTIC DEVICE USING THEM, AND ENERGIZATION CONTROL METHOD</title><date>2008-11-27</date><risdate>2008</risdate><abstract>PROBLEM TO BE SOLVED: To provide a nuclear medicine diagnostic device excelling in energy resolution and a nuclear medicine diagnostic method. SOLUTION: This nuclear medicine diagnostic device has a bonded structure made by bonding a semiconductor element S and conductive members 22A, 22B, 23A, and 23B with conductive adhesion material 24 composed of conductive particles and a resin binder. This device is equipped with a structure in which electric charge is picked up as a signal from the conductive members 22A, 22B, 23A, and 23B, via the adhesion material 24, through a detection circuit 40, the electric charge being induced when γ rays enter the semiconductor element S, and an energization control means 30 for passing an electric current through at least the adhesion material 24, the electric current being larger than an electric current caused by the electric charge induced when the γ rays enter. COPYRIGHT: (C)2009,JPO&amp;INPIT</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title CRYSTAL ELEMENT ASSEMBLY, ELECTRICAL CIRCUIT THEREFOR, NUCLEAR MEDICINE DIAGNOSTIC DEVICE USING THEM, AND ENERGIZATION CONTROL METHOD
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