UNIQUE PATTERN DETECTION SYSTEM, MODEL LEARNING DEVICE, UNIQUE PATTERN DETECTOR METHOD, AND COMPUTER PROGRAM

PROBLEM TO BE SOLVED: To achieve the efficiency of mechanical learning and the highly precise construction of a model by introducing preliminary knowledge relating to a sensor to a process for learning a normal model from the observed value of each sensor on a sensor network. SOLUTION: A model learn...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	OTA MASAKATSU, TERAMOTO MITSUO, KIN JUNEI
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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