ULTRASONIC FLAW INSPECTION METHOD AND APPARATUS
PROBLEM TO BE SOLVED: To provide an ultrasonic flaw inspection method and an apparatus for understandably displaying an internal defect even if a laminated structure is inspected under the condition that there are many noise echoes. SOLUTION: In the ultrasonic flaw inspection method of the invention...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | SAKAMOTO HIROSHI YOUSO JIROU |
description | PROBLEM TO BE SOLVED: To provide an ultrasonic flaw inspection method and an apparatus for understandably displaying an internal defect even if a laminated structure is inspected under the condition that there are many noise echoes. SOLUTION: In the ultrasonic flaw inspection method of the invention, the echoes from an internal gate and a bottom gate are detected, and a strength (a height) of the echo from the bottom gate is subtracted from a strength (a height) of the echo from the internal gate so as to be displayed. The echo appearing in the internal gate remains in an internal defect region. The echo disappears in sound portions on a surface and at the bottom. The echo due to the laminated structure member is canceled and reduced. The internal defect and an adhesion failure between layers can be vividly displayed. COPYRIGHT: (C)2009,JPO&INPIT |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2008233048A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2008233048A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2008233048A3</originalsourceid><addsrcrecordid>eNrjZNAP9QkJcgz29_N0VnDzcQxX8PQLDnB1DvH091PwdQ3x8HdRcPQD4oAAxyDHkNBgHgbWtMSc4lReKM3NoOTmGuLsoZtakB-fWlyQmJyal1oS7xVgZGBgYWRsbGBi4WhMlCIAZb8mlQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ULTRASONIC FLAW INSPECTION METHOD AND APPARATUS</title><source>esp@cenet</source><creator>SAKAMOTO HIROSHI ; YOUSO JIROU</creator><creatorcontrib>SAKAMOTO HIROSHI ; YOUSO JIROU</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide an ultrasonic flaw inspection method and an apparatus for understandably displaying an internal defect even if a laminated structure is inspected under the condition that there are many noise echoes. SOLUTION: In the ultrasonic flaw inspection method of the invention, the echoes from an internal gate and a bottom gate are detected, and a strength (a height) of the echo from the bottom gate is subtracted from a strength (a height) of the echo from the internal gate so as to be displayed. The echo appearing in the internal gate remains in an internal defect region. The echo disappears in sound portions on a surface and at the bottom. The echo due to the laminated structure member is canceled and reduced. The internal defect and an adhesion failure between layers can be vividly displayed. COPYRIGHT: (C)2009,JPO&INPIT</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081002&DB=EPODOC&CC=JP&NR=2008233048A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081002&DB=EPODOC&CC=JP&NR=2008233048A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SAKAMOTO HIROSHI</creatorcontrib><creatorcontrib>YOUSO JIROU</creatorcontrib><title>ULTRASONIC FLAW INSPECTION METHOD AND APPARATUS</title><description>PROBLEM TO BE SOLVED: To provide an ultrasonic flaw inspection method and an apparatus for understandably displaying an internal defect even if a laminated structure is inspected under the condition that there are many noise echoes. SOLUTION: In the ultrasonic flaw inspection method of the invention, the echoes from an internal gate and a bottom gate are detected, and a strength (a height) of the echo from the bottom gate is subtracted from a strength (a height) of the echo from the internal gate so as to be displayed. The echo appearing in the internal gate remains in an internal defect region. The echo disappears in sound portions on a surface and at the bottom. The echo due to the laminated structure member is canceled and reduced. The internal defect and an adhesion failure between layers can be vividly displayed. COPYRIGHT: (C)2009,JPO&INPIT</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAP9QkJcgz29_N0VnDzcQxX8PQLDnB1DvH091PwdQ3x8HdRcPQD4oAAxyDHkNBgHgbWtMSc4lReKM3NoOTmGuLsoZtakB-fWlyQmJyal1oS7xVgZGBgYWRsbGBi4WhMlCIAZb8mlQ</recordid><startdate>20081002</startdate><enddate>20081002</enddate><creator>SAKAMOTO HIROSHI</creator><creator>YOUSO JIROU</creator><scope>EVB</scope></search><sort><creationdate>20081002</creationdate><title>ULTRASONIC FLAW INSPECTION METHOD AND APPARATUS</title><author>SAKAMOTO HIROSHI ; YOUSO JIROU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2008233048A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SAKAMOTO HIROSHI</creatorcontrib><creatorcontrib>YOUSO JIROU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SAKAMOTO HIROSHI</au><au>YOUSO JIROU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ULTRASONIC FLAW INSPECTION METHOD AND APPARATUS</title><date>2008-10-02</date><risdate>2008</risdate><abstract>PROBLEM TO BE SOLVED: To provide an ultrasonic flaw inspection method and an apparatus for understandably displaying an internal defect even if a laminated structure is inspected under the condition that there are many noise echoes. SOLUTION: In the ultrasonic flaw inspection method of the invention, the echoes from an internal gate and a bottom gate are detected, and a strength (a height) of the echo from the bottom gate is subtracted from a strength (a height) of the echo from the internal gate so as to be displayed. The echo appearing in the internal gate remains in an internal defect region. The echo disappears in sound portions on a surface and at the bottom. The echo due to the laminated structure member is canceled and reduced. The internal defect and an adhesion failure between layers can be vividly displayed. COPYRIGHT: (C)2009,JPO&INPIT</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_JP2008233048A |
source | esp@cenet |
subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | ULTRASONIC FLAW INSPECTION METHOD AND APPARATUS |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T15%3A18%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SAKAMOTO%20HIROSHI&rft.date=2008-10-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2008233048A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |