RESPONSE ANALYSIS SYSTEM

RESPONSE ANALYSIS SYSTEM

PROBLEM TO BE SOLVED: To provide a technology capable of easily specifying a part having large effect on vibration reduction of an evaluating point. SOLUTION: This response analysis system comprises a maximum amplitude phase calculating means for calculating the maximum amplitude phase, in which the...

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Hauptverfasser: ARAKAWA MASASHI, YAMAOKA HIROO
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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creator ARAKAWA MASASHI
YAMAOKA HIROO
description PROBLEM TO BE SOLVED: To provide a technology capable of easily specifying a part having large effect on vibration reduction of an evaluating point. SOLUTION: This response analysis system comprises a maximum amplitude phase calculating means for calculating the maximum amplitude phase, in which the amplitude of the evaluating point when an external force is applied to an input point becomes maximum, a node force calculating means for calculating the node force at the maximum amplitude phase for each node, a contribution calculating means for calculating the contribution of each node to the maximum amplitude of the evaluating point based on the node force at the maximum amplitude phase, and an outputting means for outputting the contribution. COPYRIGHT: (C)2008,JPO&INPIT
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title RESPONSE ANALYSIS SYSTEM
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