MEASUREMENT APPARATUS MANAGEMENT SYSTEM USING IC TAG

PROBLEM TO BE SOLVED: To provide a measurement apparatus management system using an IC tag for allowing a headquarter of an electric power supplier to integrally manage measurement apparatuses for energy diagnosis and the like kept individually by respective offices. SOLUTION: IC tags are attached t...

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Bibliographische Detailangaben
1. Verfasser: KATAOKA JIRO
Format: Patent
Sprache:eng
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