PROBE UNIT AND INSPECTION DEVICE
PROBLEM TO BE SOLVED: To improve workability in maintenance by detachably attaching a component provided on an inner face of a probe unit 31 from the outside, without turning frontward the probe unit 31. SOLUTION: The probe unit 31 is used for inspecting a liquid crystal panel 37. The probe unit 31...
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| creator | AKAHIRA MEGUMI MIURA KAZUYOSHI SAITO TOYOKAZU |
| description | PROBLEM TO BE SOLVED: To improve workability in maintenance by detachably attaching a component provided on an inner face of a probe unit 31 from the outside, without turning frontward the probe unit 31. SOLUTION: The probe unit 31 is used for inspecting a liquid crystal panel 37. The probe unit 31 includes a fixed block 40 for supporting the whole, and attaching block 41 supported by the fixed block 40, a support block 42 integrally attached to the attaching block 41, a block assembly 34 inserted into the support block 42 to be supported, and a connection cable part 35 supported on an inner face of the support block 42 and electrically connected to the block assembly 34. An expanded part 70 expanded more than a width of the attaching block 41 is provided in the support block 42, and a tapped hole 71 is provided in the support block 42 to detachably attach a screw 72 for fixing the connection cable part 35 to the expanded part 70 from the outside of a device body. COPYRIGHT: (C)2008,JPO&INPIT |
| format | Patent |
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SOLUTION: The probe unit 31 is used for inspecting a liquid crystal panel 37. The probe unit 31 includes a fixed block 40 for supporting the whole, and attaching block 41 supported by the fixed block 40, a support block 42 integrally attached to the attaching block 41, a block assembly 34 inserted into the support block 42 to be supported, and a connection cable part 35 supported on an inner face of the support block 42 and electrically connected to the block assembly 34. An expanded part 70 expanded more than a width of the attaching block 41 is provided in the support block 42, and a tapped hole 71 is provided in the support block 42 to detachably attach a screw 72 for fixing the connection cable part 35 to the expanded part 70 from the outside of a device body. 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SOLUTION: The probe unit 31 is used for inspecting a liquid crystal panel 37. The probe unit 31 includes a fixed block 40 for supporting the whole, and attaching block 41 supported by the fixed block 40, a support block 42 integrally attached to the attaching block 41, a block assembly 34 inserted into the support block 42 to be supported, and a connection cable part 35 supported on an inner face of the support block 42 and electrically connected to the block assembly 34. An expanded part 70 expanded more than a width of the attaching block 41 is provided in the support block 42, and a tapped hole 71 is provided in the support block 42 to detachably attach a screw 72 for fixing the connection cable part 35 to the expanded part 70 from the outside of a device body. COPYRIGHT: (C)2008,JPO&INPIT</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING |
| title | PROBE UNIT AND INSPECTION DEVICE |
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