MATERIAL FOR TARGET MATERIAL DETECTION, ELEMENT FOR TARGET MATERIAL DETECTION, AND DETECTION METHOD OF TARGET MATERIAL

MATERIAL FOR TARGET MATERIAL DETECTION, ELEMENT FOR TARGET MATERIAL DETECTION, AND DETECTION METHOD OF TARGET MATERIAL

PROBLEM TO BE SOLVED: To improve reaction efficiency without lowering sensitivity when detecting a target material. SOLUTION: This material for target material detection for detecting the target material in a specimen has a metal particle for generating localized surface plasmon resonance, a portion...

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Hauptverfasser: OGAWA YOSHINORI, OKANO MIE, NAKAHAMA KAZUMICHI
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator OGAWA YOSHINORI
OKANO MIE
NAKAHAMA KAZUMICHI
description PROBLEM TO BE SOLVED: To improve reaction efficiency without lowering sensitivity when detecting a target material. SOLUTION: This material for target material detection for detecting the target material in a specimen has a metal particle for generating localized surface plasmon resonance, a portion contracted by external stimulus bonded to the metal particle, and a capturing position for capturing the target material bonded to the portion contracted by the external stimulus, and has a characteristic wherein the distance between the metal particle and the capturing position is changed by the external stimulus. COPYRIGHT: (C)2008,JPO&INPIT
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title MATERIAL FOR TARGET MATERIAL DETECTION, ELEMENT FOR TARGET MATERIAL DETECTION, AND DETECTION METHOD OF TARGET MATERIAL
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