OPTICAL SPECTRUM ANALYZER
PROBLEM TO BE SOLVED: To achieve an optical spectrum analyzer capable of performing wavelength sweeping at a high-speed and obtaining high wavelength resolution. SOLUTION: The spectrum analyzer for separating light to be measured by a diffraction grating and measuring the separated light to be measu...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | OTA HIROYUKI SUGIHARA YOSHINOBU OISHI KAZUJI |
| description | PROBLEM TO BE SOLVED: To achieve an optical spectrum analyzer capable of performing wavelength sweeping at a high-speed and obtaining high wavelength resolution. SOLUTION: The spectrum analyzer for separating light to be measured by a diffraction grating and measuring the separated light to be measured to obtain an optical spectrum is improved. The analyzer includes a deflection means for changing an incident angle of the light to be measured incident on the diffraction grating; a light receiving means for receiving the separated light to be measured and outputting an electric signal corresponding to the light intensity; and a signal processing part obtaining the optical spectrum of the light to be measured on the basis of the electric signal from the light receiving means. The plurality of light receiving means are arranged along the direction of wavelength dispersion of the diffraction grating, and output the electric signals independently from each other. COPYRIGHT: (C)2007,JPO&INPIT |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2007198938A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2007198938A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2007198938A3</originalsourceid><addsrcrecordid>eNrjZJD0DwjxdHb0UQgOcHUOCQr1VXD0c_SJjHIN4mFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYG5oaWFpbGFo7GRCkCAGYRILc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTICAL SPECTRUM ANALYZER</title><source>esp@cenet</source><creator>OTA HIROYUKI ; SUGIHARA YOSHINOBU ; OISHI KAZUJI</creator><creatorcontrib>OTA HIROYUKI ; SUGIHARA YOSHINOBU ; OISHI KAZUJI</creatorcontrib><description>PROBLEM TO BE SOLVED: To achieve an optical spectrum analyzer capable of performing wavelength sweeping at a high-speed and obtaining high wavelength resolution. SOLUTION: The spectrum analyzer for separating light to be measured by a diffraction grating and measuring the separated light to be measured to obtain an optical spectrum is improved. The analyzer includes a deflection means for changing an incident angle of the light to be measured incident on the diffraction grating; a light receiving means for receiving the separated light to be measured and outputting an electric signal corresponding to the light intensity; and a signal processing part obtaining the optical spectrum of the light to be measured on the basis of the electric signal from the light receiving means. The plurality of light receiving means are arranged along the direction of wavelength dispersion of the diffraction grating, and output the electric signals independently from each other. COPYRIGHT: (C)2007,JPO&INPIT</description><language>eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070809&DB=EPODOC&CC=JP&NR=2007198938A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070809&DB=EPODOC&CC=JP&NR=2007198938A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OTA HIROYUKI</creatorcontrib><creatorcontrib>SUGIHARA YOSHINOBU</creatorcontrib><creatorcontrib>OISHI KAZUJI</creatorcontrib><title>OPTICAL SPECTRUM ANALYZER</title><description>PROBLEM TO BE SOLVED: To achieve an optical spectrum analyzer capable of performing wavelength sweeping at a high-speed and obtaining high wavelength resolution. SOLUTION: The spectrum analyzer for separating light to be measured by a diffraction grating and measuring the separated light to be measured to obtain an optical spectrum is improved. The analyzer includes a deflection means for changing an incident angle of the light to be measured incident on the diffraction grating; a light receiving means for receiving the separated light to be measured and outputting an electric signal corresponding to the light intensity; and a signal processing part obtaining the optical spectrum of the light to be measured on the basis of the electric signal from the light receiving means. The plurality of light receiving means are arranged along the direction of wavelength dispersion of the diffraction grating, and output the electric signals independently from each other. COPYRIGHT: (C)2007,JPO&INPIT</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD0DwjxdHb0UQgOcHUOCQr1VXD0c_SJjHIN4mFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYG5oaWFpbGFo7GRCkCAGYRILc</recordid><startdate>20070809</startdate><enddate>20070809</enddate><creator>OTA HIROYUKI</creator><creator>SUGIHARA YOSHINOBU</creator><creator>OISHI KAZUJI</creator><scope>EVB</scope></search><sort><creationdate>20070809</creationdate><title>OPTICAL SPECTRUM ANALYZER</title><author>OTA HIROYUKI ; SUGIHARA YOSHINOBU ; OISHI KAZUJI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2007198938A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OTA HIROYUKI</creatorcontrib><creatorcontrib>SUGIHARA YOSHINOBU</creatorcontrib><creatorcontrib>OISHI KAZUJI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OTA HIROYUKI</au><au>SUGIHARA YOSHINOBU</au><au>OISHI KAZUJI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTICAL SPECTRUM ANALYZER</title><date>2007-08-09</date><risdate>2007</risdate><abstract>PROBLEM TO BE SOLVED: To achieve an optical spectrum analyzer capable of performing wavelength sweeping at a high-speed and obtaining high wavelength resolution. SOLUTION: The spectrum analyzer for separating light to be measured by a diffraction grating and measuring the separated light to be measured to obtain an optical spectrum is improved. The analyzer includes a deflection means for changing an incident angle of the light to be measured incident on the diffraction grating; a light receiving means for receiving the separated light to be measured and outputting an electric signal corresponding to the light intensity; and a signal processing part obtaining the optical spectrum of the light to be measured on the basis of the electric signal from the light receiving means. The plurality of light receiving means are arranged along the direction of wavelength dispersion of the diffraction grating, and output the electric signals independently from each other. COPYRIGHT: (C)2007,JPO&INPIT</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_JP2007198938A |
| source | esp@cenet |
| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | OPTICAL SPECTRUM ANALYZER |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T08%3A15%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=OTA%20HIROYUKI&rft.date=2007-08-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2007198938A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |