METHOD OF FORMING THIN FILM BY MEANS OF ATOMIC LAYER DEPOSITION AND CHEMICAL VAPOR DEPOSITION

PROBLEM TO BE SOLVED: To provide a film of such a high quality as is conventionally unable to achieve by successively performing both atomic layer deposition and chemical vapor deposition in a single reactor. SOLUTION: The method of forming a thin film on a substrate is implemented using an upper ch...

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Bibliographische Detailangaben
Hauptverfasser: ARAMI JIYUNICHI, JINRIKI HIROSHI
Format: Patent
Sprache:eng
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