MANUFACTURING METHOD FOR ELECTRO-OPTICAL DEVICE, INSPECTING METHOD FOR CONNECTION RESISTANCE, AND THE ELECTRO-OPTICAL DEVICE
PROBLEM TO BE SOLVED: To provide a manufacturing method for an electrooptical device and an inspecting method that can reduce display defects, by preventing the connection resistance of the electrooptical device that has a prescribed electric wiring structure from increasing. SOLUTION: The manufactu...
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| creator | MINO YOICHI TAGUCHI SATOSHI WATANABE TADASHI |
| description | PROBLEM TO BE SOLVED: To provide a manufacturing method for an electrooptical device and an inspecting method that can reduce display defects, by preventing the connection resistance of the electrooptical device that has a prescribed electric wiring structure from increasing. SOLUTION: The manufacturing method for the electrooptical device which has a first wiring line and a second wiring line electrically connected via a first contact hole bored in a first insulating film includes a step of forming a plurality of inspection patterns, which have an equal number of second contact hole parts and differ in the number of second contact hole parts from each another. COPYRIGHT: (C)2007,JPO&INPIT |
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SOLUTION: The manufacturing method for the electrooptical device which has a first wiring line and a second wiring line electrically connected via a first contact hole bored in a first insulating film includes a step of forming a plurality of inspection patterns, which have an equal number of second contact hole parts and differ in the number of second contact hole parts from each another. 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SOLUTION: The manufacturing method for the electrooptical device which has a first wiring line and a second wiring line electrically connected via a first contact hole bored in a first insulating film includes a step of forming a plurality of inspection patterns, which have an equal number of second contact hole parts and differ in the number of second contact hole parts from each another. COPYRIGHT: (C)2007,JPO&INPIT</description><subject>ADVERTISING</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CRYPTOGRAPHY</subject><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</subject><subject>DISPLAY</subject><subject>DISPLAYING</subject><subject>EDUCATION</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FREQUENCY-CHANGING</subject><subject>LABELS OR NAME-PLATES</subject><subject>NON-LINEAR OPTICS</subject><subject>OPTICAL ANALOGUE/DIGITAL CONVERTERS</subject><subject>OPTICAL LOGIC ELEMENTS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>SEALS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SIGNS</subject><subject>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZKjxdfQLdXN0DgkN8vRzV_B1DfHwd1Fw8w9ScPVxdQ4J8tf1DwjxdHb0UXBxDfN0dtVR8PQLDgDKoKl29vfzA4n6-ykEuQZ7Boc4-oEUO_q5KIR4uOIwjIeBNS0xpziVF0pzMyi5uYY4e-imFuTHpxYXJCan5qWWxHsFGBkYmBuYGxkYWzoaE6UIAPTtO2Y</recordid><startdate>20070322</startdate><enddate>20070322</enddate><creator>MINO YOICHI</creator><creator>TAGUCHI SATOSHI</creator><creator>WATANABE TADASHI</creator><scope>EVB</scope></search><sort><creationdate>20070322</creationdate><title>MANUFACTURING METHOD FOR ELECTRO-OPTICAL DEVICE, INSPECTING METHOD FOR CONNECTION RESISTANCE, AND THE ELECTRO-OPTICAL DEVICE</title><author>MINO YOICHI ; TAGUCHI SATOSHI ; WATANABE TADASHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2007072039A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><topic>ADVERTISING</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CRYPTOGRAPHY</topic><topic>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</topic><topic>DISPLAY</topic><topic>DISPLAYING</topic><topic>EDUCATION</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FREQUENCY-CHANGING</topic><topic>LABELS OR NAME-PLATES</topic><topic>NON-LINEAR OPTICS</topic><topic>OPTICAL ANALOGUE/DIGITAL CONVERTERS</topic><topic>OPTICAL LOGIC ELEMENTS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>SEALS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SIGNS</topic><topic>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</topic><toplevel>online_resources</toplevel><creatorcontrib>MINO YOICHI</creatorcontrib><creatorcontrib>TAGUCHI SATOSHI</creatorcontrib><creatorcontrib>WATANABE TADASHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MINO YOICHI</au><au>TAGUCHI SATOSHI</au><au>WATANABE TADASHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MANUFACTURING METHOD FOR ELECTRO-OPTICAL DEVICE, INSPECTING METHOD FOR CONNECTION RESISTANCE, AND THE ELECTRO-OPTICAL DEVICE</title><date>2007-03-22</date><risdate>2007</risdate><abstract>PROBLEM TO BE SOLVED: To provide a manufacturing method for an electrooptical device and an inspecting method that can reduce display defects, by preventing the connection resistance of the electrooptical device that has a prescribed electric wiring structure from increasing. SOLUTION: The manufacturing method for the electrooptical device which has a first wiring line and a second wiring line electrically connected via a first contact hole bored in a first insulating film includes a step of forming a plurality of inspection patterns, which have an equal number of second contact hole parts and differ in the number of second contact hole parts from each another. COPYRIGHT: (C)2007,JPO&INPIT</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | ADVERTISING BASIC ELECTRIC ELEMENTS CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY DISPLAYING EDUCATION ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FREQUENCY-CHANGING LABELS OR NAME-PLATES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS SEMICONDUCTOR DEVICES SIGNS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF |
| title | MANUFACTURING METHOD FOR ELECTRO-OPTICAL DEVICE, INSPECTING METHOD FOR CONNECTION RESISTANCE, AND THE ELECTRO-OPTICAL DEVICE |
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