METHOD OF DETECTING DISCONNECTION OF WIRE SAW, METHOD OF INSPECTION QUALITY, AND METHOD OF MANUFACTURING CUT PRODUCT

PROBLEM TO BE SOLVED: To provide a resin bond wire saw to be used in slicing a silicon wafer, which is electrically conductive by itself, and has a high retention force of abrasive grains and excellent sharpness. SOLUTION: One end of a metal coated abrasive grain is brought into contact with a metal...

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Hauptverfasser: OGAWA HIDEKI, YAMANAKA MASAAKI, URAKAWA NOBUO, HARA AKIO
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creator OGAWA HIDEKI
YAMANAKA MASAAKI
URAKAWA NOBUO
HARA AKIO
description PROBLEM TO BE SOLVED: To provide a resin bond wire saw to be used in slicing a silicon wafer, which is electrically conductive by itself, and has a high retention force of abrasive grains and excellent sharpness. SOLUTION: One end of a metal coated abrasive grain is brought into contact with a metallic core wire 1 and part of it is exposed from a bonded surface, thereby providing electric conductivity to the core wire from the external surface of the wire saw so as to detect disconnection during processing. In addition, bonding strength with a resin 3 serving as a bond is improved through the use of the metal coated abrasive grain 2, and further increased by plating the core wire 1 with copper or copper alloy, to thereby prevent the abrasive grain from missing or the bond from peeling. Two conductive rolls are used to inspect the disconnection of the wire saw. COPYRIGHT: (C)2007,JPO&INPIT
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subjects BASIC ELECTRIC ELEMENTS
DRESSING OR CONDITIONING OF ABRADING SURFACES
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
GRINDING
MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING
PERFORMING OPERATIONS
POLISHING
SEMICONDUCTOR DEVICES
TOOLS FOR GRINDING, BUFFING, OR SHARPENING
TRANSPORTING
title METHOD OF DETECTING DISCONNECTION OF WIRE SAW, METHOD OF INSPECTION QUALITY, AND METHOD OF MANUFACTURING CUT PRODUCT
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