TESTING SYSTEM AND TESTING METHOD
PROBLEM TO BE SOLVED: To provide a testing system capable of verifying the operation of a device without any separate test equipment, and to provide a method for testing the testing system. SOLUTION: The testing system includes a reference chip 100 for generating test data, and a test target chip 20...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a testing system capable of verifying the operation of a device without any separate test equipment, and to provide a method for testing the testing system. SOLUTION: The testing system includes a reference chip 100 for generating test data, and a test target chip 200 to which test data are input to return the test data to a reference chip. The reference chip compares the test data with the returned test data and discriminates whether the test target chip operates steadily, thus dispensing with separate, expensive test equipment and obtaining effect for reducing the cost of products. COPYRIGHT: (C)2007,JPO&INPIT |
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