ABNORMALITY DIAGNOSTIC DEVICE, ABNORMALITY DIAGNOSTIC METHOD, AND ABNORMALITY DIAGNOSTIC PROGRAM

PROBLEM TO BE SOLVED: To provide an abnormality diagnostic device capable of estimating the value of an object to be estimated in consideration of an influence exerted by the object. SOLUTION: In the abnormality diagnostic method of the abnormality diagnostic device which has a measurement data stor...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: MATSUSHIMA YOSUKE
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide an abnormality diagnostic device capable of estimating the value of an object to be estimated in consideration of an influence exerted by the object. SOLUTION: In the abnormality diagnostic method of the abnormality diagnostic device which has a measurement data storage part wherein measurement data obtained by measuring an object to be measured in a plant is stored as a history, and diagnoses abnormalities of the plant, measurement data obtained by measuring the object to be measured in the plant is acquired, and the measurement data stored in the measurement data storage part is read out, and a multiple regression parameter is calculated, and an estimate value of an object quantity is calculated on the basis of the calculated multiple regression parameter and the acquired measurement data, and a difference between the calculated estimate value and the acquired measurement data is calculated, and the calculated difference is integrated to calculate an integral value, and the calculated integral value is compared with a reference value, and an alarm is outputted when the integral value is equal to or larger than the reference value. COPYRIGHT: (C)2007,JPO&INPIT